2011
DOI: 10.1016/j.sse.2010.11.029
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Modeling of program, erase and retention characteristics of charge-trap gate all around memories

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Cited by 5 publications
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“…Here, ϕ t is the trap energy level below the conduction band. The electric field in the GAA geometry can be expressed by a closed-form function by applying Gauss' law: [25][26][27][28])…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Here, ϕ t is the trap energy level below the conduction band. The electric field in the GAA geometry can be expressed by a closed-form function by applying Gauss' law: [25][26][27][28])…”
Section: Experimental Methodsmentioning
confidence: 99%