2004
DOI: 10.1016/j.micron.2004.01.010
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Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si (111) wafer

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Cited by 6 publications
(7 citation statements)
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“…In an interesting approach, polycrystalline GaN films with improved structural quality have been deposited over ZnO buffer layers on silicon substrates, using MBE [43], MOCVD [44,45] and pulsed laser deposition (PLD) [46,47] techniques. High quality epilayers of GaN have also been deposited on ZnO buffer layer over sapphire substrates, using this approach [44,48,49].…”
Section: Introductionmentioning
confidence: 99%
“…In an interesting approach, polycrystalline GaN films with improved structural quality have been deposited over ZnO buffer layers on silicon substrates, using MBE [43], MOCVD [44,45] and pulsed laser deposition (PLD) [46,47] techniques. High quality epilayers of GaN have also been deposited on ZnO buffer layer over sapphire substrates, using this approach [44,48,49].…”
Section: Introductionmentioning
confidence: 99%
“…ZnO thin films have also recently been investigated for use as potential 'compliant' layers to enable the deposition of single-crystal gallium nitride (GaN) on silicon substrates [5][6][7]. The term 'compliant' suggests that the interlayer, in this case ZnO, is able to elastically accommodate any lattice mis-match between the silicon substrate and the III-V film [8].…”
Section: Introductionmentioning
confidence: 99%
“…ZnO thin films have been grown by a variety of techniques, such as radiofrequency or magnetron sputtering [9,10], spray pyrolysis [11], molecular beam epitaxy (MBE) [5][6][7] and metalorganic chemical vapour deposition (MOCVD) [12][13][14][15][16] [15] undergo a serious pre-reaction with oxygen leading to heavy particulate contamination and blocked reactor inlet lines. This pre-reaction can be reduced by the use of less reactive oxygen sources such as N 2 O [16,17] or NO 2 [16].…”
Section: Introductionmentioning
confidence: 99%
“…In fact, they have already been used as buffer layers for each other. [10][11][12] Various techniques, including PLD, 12 CVD, 13 and MBE, 14 have been utilized to grow ZnO-buffered GaN films on various substrates. However, the optical properties of these as-grown films were not satisfied, especially on Si substrates.…”
Section: Introductionmentioning
confidence: 99%