2011 International Conference on Infrared, Millimeter, and Terahertz Waves 2011
DOI: 10.1109/irmmw-thz.2011.6105162
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Micromachined probes for on-wafer characterization of terahertz and submillimeter-wave components

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“…The use of SOI in this work stems from past research at UVA on integrated hot-electron bolometers [39] and co-planar waveguide (CPW) micromachined probes for on-wafer measurements [40], [41]. In the case of the integrated bolometer, shown in Figure 2.4, SOI was used to simplify the fabrication and assembly by creating beamleads to allow a 3 μm silicon support substrate to be utilized as a carrier.…”
Section: Gaas Diodes On Thin Silicon Membranesmentioning
confidence: 99%
“…The use of SOI in this work stems from past research at UVA on integrated hot-electron bolometers [39] and co-planar waveguide (CPW) micromachined probes for on-wafer measurements [40], [41]. In the case of the integrated bolometer, shown in Figure 2.4, SOI was used to simplify the fabrication and assembly by creating beamleads to allow a 3 μm silicon support substrate to be utilized as a carrier.…”
Section: Gaas Diodes On Thin Silicon Membranesmentioning
confidence: 99%