DOI: 10.18130/v3054j
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Submillimeter-Wave Quasi-Vertical GaAs Schottky Diodes Integrated on Silicon Membranes

Abstract: GaAs Schottky diodes are the central component of Terahertz (THz) metrology instrumentation. The frequency translating property of the Schottky diode is used in ground and space based observatories and for characterization of other THz devices. As detectors, GaAs Schottky diodes are used for measuring signal power levels, as mixers they are used in heterodyne receivers, and as variable capacitors they are used in frequency multipliers.The focus of this dissertation is the integration of GaAs Schottky diodes on… Show more

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Cited by 3 publications
(8 citation statements)
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References 51 publications
(62 reference statements)
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“…The chip analyzed in this work is based on the 160 GHz balanced quadrupler detailed in [3]. The finite element method solution to the heat equation is aquired using Ansys R Mechanical, using the thermal conductivities measured above.…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
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“…The chip analyzed in this work is based on the 160 GHz balanced quadrupler detailed in [3]. The finite element method solution to the heat equation is aquired using Ansys R Mechanical, using the thermal conductivities measured above.…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
“…Furthermore, all the non-contact surfaces of the block are assumed to be at room temperature, i.e. 23.0 • C. The quadrupler chip is designed [3] such that it is suspended in the waveguide block, with protruding gold beam leads clamping it to the waveguide block at the input and output (see Figure 3(a)). Two additional beamleads protrude from hairpin bias chokes and are bonded to a quartz-supported filter that sits in the block.…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Due to its relatively low conductivity, however, the 1.0 µm thick nickel layer is deposited only over a small area near contact points, as illustrated in Fig. 2.19a [25].…”
Section: Tip Metallization and Probe Contact Resistancementioning
confidence: 99%
“…Simulated results, for a low frequency proof of concept, of the diode model presented in [10] can be seen in figure 12. Figure 12 shows the significant variability of impedances of the diode at three different bias points.…”
Section: The Diode As a Calibration Standardmentioning
confidence: 99%