2020
DOI: 10.1088/1361-6668/ab8619
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Microfabrication of NdFeAs(O,F) thin films and evaluation of the transport properties

Abstract: Submicron sized strip lines of NdFeAs(O,F) were fabricated and the transport properties were studied. By using laser lithography and dry etching, strip lines with a width as low as 0.84 µm were fabricated. The superconducting critical temperature was not seriously affected by the fabrication process, but a significant decrease of the critical current density (J c ) was observed for strip lines narrower than 2 µm when the sample was etched in Ar plasma. By employing a plasma free method on the other hand, the d… Show more

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Cited by 2 publications
(5 citation statements)
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“…Similar to T c , the reduction in J c with decreasing the line width of the NdFeAs(O,H) microstrips fabricated under condition #2 was smaller than those of condition #1 and NdFeAs(O,F) microstrips [33] as shown in figure 3(b). During the Ar-RIE process, the thin films were etched while exposed to Ar plasma.…”
Section: Resultsmentioning
confidence: 73%
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“…Similar to T c , the reduction in J c with decreasing the line width of the NdFeAs(O,H) microstrips fabricated under condition #2 was smaller than those of condition #1 and NdFeAs(O,F) microstrips [33] as shown in figure 3(b). During the Ar-RIE process, the thin films were etched while exposed to Ar plasma.…”
Section: Resultsmentioning
confidence: 73%
“…Here, T c of the microstrips (T c line ) was normalized to that of the films measured prior to microfabrication (T c film ). In addition, our previous results of NdFeAs(O,F) microstrips that were fabricated by Ar-RIE [33] are also plotted for comparison. As shown in figure 3(a), NdFeAs(O,H) microstrips fabricated under condition #1 retained a T c of about 90% or more of that before microfabrication down to the line width of 1.5 µm.…”
Section: Resultsmentioning
confidence: 99%
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