“…Thereby, a single MW based heterojunction diode was fabricated. 6,23,40,42,43 Analysis instruments Single ZnO:Ga MWs, Ag nanostructures, and MWs covered by Ag nanostructures were characterized using scanning electron microscopy (SEM). The current-voltage (I-V) characteristics of the single MW based metal-MW-metal structure and the single MW based heterojunction diode were investigated using a Keysight semiconductor device analyzer (B1500A).…”