2016
DOI: 10.1049/iet-pel.2015.0799
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Methodology for analysing radiated EMI characteristics using transient time domain measurements

Abstract: In this study the switching characteristics of semiconductors are investigated as a main source of radiated electromagnetic interference (EMI). Especially, characteristic oscillations after the switching process influence the EMI characteristic of the circuit under investigation in the high frequency range. A method is introduced that analyses the turn-on and the turn-off characteristic of a MOSFET within a power factor correction stage separately, which are the critical source of EMI. A modified Hann window f… Show more

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Cited by 12 publications
(4 citation statements)
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“…6 b . Driver board isset to generate driving signals for insulated gate bipolar transistors andelectromagnetic interference can be neglected [30].…”
Section: Laboratory Test Resultsmentioning
confidence: 99%
“…6 b . Driver board isset to generate driving signals for insulated gate bipolar transistors andelectromagnetic interference can be neglected [30].…”
Section: Laboratory Test Resultsmentioning
confidence: 99%
“…In switching mode power converters, the turn‐on and turn‐off of power semiconductors are the main cause of EMI as clearly reported in previous research works [20–23]. Indeed, during the switching operation, the parasitic capacitors resonate with the parasitic inductors of the circuit giving rise to transient oscillations.…”
Section: Theoretical Backgroundmentioning
confidence: 91%
“…For a 1kW 400 V GaN HEMT device, the conducted EMI measured was found to be 20 dB higher at 500 KHz switching frequency compared to EMI at 50 kHz switching frequency. Thus, the conductive EMI is the most severe when WBG devices function at higher switching frequency and speed compared to Si-devices [86].…”
Section: Merits and Challenges Of Using Wbg Semiconductor Devicesmentioning
confidence: 99%