2010 IEEE International Integrated Reliability Workshop Final Report 2010
DOI: 10.1109/iirw.2010.5706501
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Memory reliability model for accumulated and clustered soft errors

Soon-Young Lee
1
,
Sanghyeon Baeg
2
,
Pedro Reviriego
3
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Cited by 3 publications
(1 citation statement)
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“…Thus, we also modeled the occurrence probability of different MBU shapes caused by an SEU, as shown in work by Lee, Baeg, and Reviriego. 6 …”
Section: Seus In the Data Cachementioning
confidence: 99%

A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience

Kleeberger1,
Gimmler-Dumont
2
,
Weis3
et al. 2013
IEEE Micro
20
1
13
0
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“…Thus, we also modeled the occurrence probability of different MBU shapes caused by an SEU, as shown in work by Lee, Baeg, and Reviriego. 6 …”
Section: Seus In the Data Cachementioning
confidence: 99%

A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience

Kleeberger1,
Gimmler-Dumont
2
,
Weis3
et al. 2013
IEEE Micro
20
1
13
0
View full textAdd to dashboardCite

Memory Reliability Model for Accumulated and Clustered Soft Errors

Lee
1
,
Baeg
2
,
Reviriego
3
2011
IEEE Trans. Nucl. Sci.
11
0
4
0
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The Impact of Soft Error Event Topography on the Reliability of Computer Memories

Ogden
1
,
Mascagni2
2017
IEEE Trans. Rel.
10
0
6
0
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