1992
DOI: 10.1016/0168-9002(92)90613-9
|View full text |Cite
|
Sign up to set email alerts
|

Measurements of the response function of silicon diode detectors for heavy ions using a time of flight technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1994
1994
2021
2021

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 13 publications
(1 citation statement)
references
References 29 publications
0
1
0
Order By: Relevance
“…Detection of ionizing particles with high energy loss in solid state detectors may lead to a pronounced pulse height defect (PHD) [38,[43][44][45][46][47], which is defined as the energy difference ΔE between the kinetic energy E k deposited by an incident ion impinging the detector and the apparent energy E DD derived from the measured electric signal [38]:…”
Section: Pulse Height Defectmentioning
confidence: 99%
“…Detection of ionizing particles with high energy loss in solid state detectors may lead to a pronounced pulse height defect (PHD) [38,[43][44][45][46][47], which is defined as the energy difference ΔE between the kinetic energy E k deposited by an incident ion impinging the detector and the apparent energy E DD derived from the measured electric signal [38]:…”
Section: Pulse Height Defectmentioning
confidence: 99%