Measurements of Residual Stresses in Micron Regions by Using Synchrotron Excited Kossel Diffraction

Abstract

In 1996, we performed the first measurements of residual stresses by using synchrotron excited KOSSEL diffraction (at the beamline L of the HASYLAB, Hamburg). Our first findings as well as the principle of the determination procedure for obtaining residual stresses from KOSSEL lines are presented. The KOSSEL technique is a very suitable method for fast measurements of local residual stresses in micron regions. Because of the high lateral resolution even residual stresses of third order (inhomogeneities of the stress state within a grain) can be proved and calculated.Im Jahre 1996 führten wir die ersten Eigenspannungsmessungen mittels synchrotronstrahlangeregter KOSSEL-Beugung (an Beamline L des HASYLAB, Hamburg) durch. Die ersten Ergebnisse und das Prinzip der Eigenspannungsbestimmung werden hiermit vorgestellt. Die KOSSEL-Technik eignet sich besonders für schnelle lokale Eigenspannungsanalysen in Mikrobereichen. Aufgrund der hohen lateralen Auflösung können sogar Eigenspannungen III. Art nachgewiesen und berechnet werden.

Synchrotron X-Ray Microdiffraction Studies of Electromigration in Interconnect lines at the Advanced Light Source

“…[7]. For x-ray fluorescing material, Kossel lines can be analyzed to derive strain as well [8]. The potential of Laue diffraction for microstructural studies becomes particularly useful when the x-ray beam size is smaller than the constitutive grain size of a polycrystalline material.…”

X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique

“…A new X-ray diffraction technique, marked by the authors as X-ray Rotation-Tilt (XRT) Method and based on an idea of our own from 1977 (ULLRICH et al 1977, 1982and BAUCH 1986, has been developed within the scope of a project of the Deutsche Forschungsgemeinschaft.…”

A comparison of the KOSSEL and the X‐ray Rotation‐Tilt Technique

“…Therefore, these techniques can be applied to a wide range of problems in materials diagnostics, e.g. ; high-accuracy determination of crystallographic orientations (for example small grain boundary angles of rotation and tilt angles ≥0.02°), dislocation density determination, determination of decrease in symmetry, high-accuracy determination of lattice constants (∆a/a ≤10 -5 , in special cases 3 * 10 -6 ), precision determination of interplanar spacings (local stresses/strains ∆d/d ≤10 -5 ) and phase identification in micron regions (see also [2,4,5,6,11,12,16]). A modern overview on equipment, detection, and evaluation of these two methods is given in [11,12].…”

“…However, the necessary exposure times differ greatly. Therefore, the KOSSEL technique is particularly suitable for a fast residual stress analysis with high accuracy and high lateral resolution [16,12,4].…”