2004
DOI: 10.1109/tdei.2004.1306725
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Measurement technique for high frequency characterization of semi-conducting materials in extruded cables

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Cited by 59 publications
(57 citation statements)
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“…A6. The high-frequency behavior of the lossy dielectric insulations is taken into account by the extension of the bottom-up model with the MTL analysis presented in [24,27,38,39,44,45,49,[67][68][69]. At high frequencies, the relevant losses vary from low to very high.…”
Section: The Physical Bpl Layermentioning
confidence: 99%
“…A6. The high-frequency behavior of the lossy dielectric insulations is taken into account by the extension of the bottom-up model with the MTL analysis presented in [24,27,38,39,44,45,49,[67][68][69]. At high frequencies, the relevant losses vary from low to very high.…”
Section: The Physical Bpl Layermentioning
confidence: 99%
“…In many modern cables semiconducting swelling tapes arewrapped around the insulation screen. Because theelectrical properties of this layer are similar to theinsulation screen [5], we consider this layer to be part ofthe insulation screen. The conductor shield is a metallic layer.…”
Section: Cablementioning
confidence: 99%
“…In many modern cables semi-conducting swelling tapes are wrapped around the insulation screen. Because the electrical properties of this layer are similar to the insulation screen [2], we consider this layer to be part of the insulation screen. 6.…”
Section: Single-core Xlpe Cablementioning
confidence: 99%
“…PARAMETER APPROXIMATIONS Accurate modeling of the transmission line parameters is discussed in several publications, such as [2]. Unfortunately, these models require detailed knowledge of the cable.…”
Section: Transmission Line Modelmentioning
confidence: 99%
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