Propagation losses occur in medium voltage power cables as pulses propagate through them. Since cables have many components, these can make different contributions to the propagation losses. The relative contributions of the conductors, insulation and semi-conducting screens to the propagation characteristics of the cable are analyzed. The propagation characteristics of the cables are studied by a developed "approximate" model providing analytical expressions that can quantify the contributions to the losses by the different parts of the conductor and dielectric system. The model is compared with an "exact" model and is tested on four cables.
In this study, a high frequency measurement technique to characterize the semi-conducting materials of the medium voltage XLPE cables in the frequency range of 30 WZ to 500 M H z has been developed. The influence of the experimental set-up and the sample preparation methods are investigated. A dielectric response model is then developed for the semiconducting materials and this is incorporated into a model for the whole cable. The propagation characteristics obtained from the cable model are then compared with those obtained from measurements carried out on the actual XLPE cables.
Understanding the high frequency characteristics of the materials that make up medium voltage extruded cables is important in establishing diagnostics schemes based on electromagnetic pulse propagation methods. Two measurement techniques have been developed and used to characterize the high frequency material properties of semi-conducting screens and cross linked polyethylene (XLPE) insulation up to 100MHz. The experimental details, parameter extraction and limitations of the two measurement techniques are presented.
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