1994
DOI: 10.1007/bf00971959
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Measurement selection for parametric IC fault diagnosis

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Cited by 5 publications
(6 citation statements)
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“…In [17,8], the authors report the importance of having training samples near the boundary of the acceptance region, to obtain good estimates of the parameters required for the test criterion. In order to obtain sample elements on both sides of the separating hyperplane and to retain the physically interpretability, we generate training and validation sample elements according to a normal distribution with an expected value x w , while keeping covariance matrix x .…”
Section: Sample Generationmentioning
confidence: 99%
See 2 more Smart Citations
“…In [17,8], the authors report the importance of having training samples near the boundary of the acceptance region, to obtain good estimates of the parameters required for the test criterion. In order to obtain sample elements on both sides of the separating hyperplane and to retain the physically interpretability, we generate training and validation sample elements according to a normal distribution with an expected value x w , while keeping covariance matrix x .…”
Section: Sample Generationmentioning
confidence: 99%
“…Please note that this extension of the definition of a faulty circuit is based on similar considerations as in [8,9,23]. In the approach proposed in this paper, these rather crude test criteria take effect only when no given specification induces a reasonable limit for permissible parameter deviations.…”
Section: Bounding the Acceptance Regionmentioning
confidence: 99%
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“…A hypothesis test is performed with respect to parametric faults. In [7], neural networks are used for fault diagnosis of analog circuits, and different methods for establishing training data sets are investigated. In both approaches, the fault model with respect to parametric faults is geometrically defined in the parameter space.…”
Section: Introductionmentioning
confidence: 99%
“…In both approaches, the fault model with respect to parametric faults is geometrically defined in the parameter space. In [6], hyperellipsoids that represent the process statistics are used, while in [7], coordinate hyperplanes are assumed that bound parameter tolerances. As analog testing consists of validating a circuit's functionality, e.g.…”
Section: Introductionmentioning
confidence: 99%