Design based analog testing by characteristic observation inference

Lindermeir, W.M.; Graeb, Helmut; Antreich, K.J.

doi:10.1109/iccad.1995.480193

Cited by 32 publications

(28 citation statements)

References 14 publications

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“…Although the testing methods in [1] and [31]- [34] can check if a circuit satisfies the specifications or not, these tests cannot be used to get any information about the performance parameters of the circuit. The test engineer has to decide about the quality of the product by looking at an abstract quantity such as a linear combination of the test measurements [1], [31]- [34].…”

Section: B Contributions Of the Proposed Approachmentioning

confidence: 99%

“…The test engineer has to decide about the quality of the product by looking at an abstract quantity such as a linear combination of the test measurements [1], [31]- [34]. In the proposed testing method, the performance parameters of the CUT is predicted from the transient response of the CUT.…”

Section: B Contributions Of the Proposed Approachmentioning

confidence: 99%

“…In [34], sensitivity-based approximations were used to derive alternate tests for linear analog circuits. In all the methods described above [1], [31]- [34], test decisions were made by looking at a linear combination of the test measurements. A linear combination of test measurements define a hyperplane in an dimensional space.…”

Section: ) Static DC Testingmentioning

confidence: 99%

“…In [1] and [31], a set of dc and low-frequency test measurements were used to check for circuit specifications. In [32], white noise was used as an alternate test signal to test linear time invariant (LTI) analog circuits.…”

Section: ) Static DC Testingmentioning

confidence: 99%

See 3 more Smart Citations

Prediction of analog performance parameters using fast transient testing

Variyam

Cherubal²,

Chatterjee

2002

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

227

116

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Abstract-In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit's performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodology is demonstrated in a production environment using a low-power opamp. Result from production test data showed: 1) a ten times speedup in production testing; 2) accurate prediction of the performance parameters; and (3) a simpler test configuration.

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Section: B Contributions Of the Proposed Approachmentioning

confidence: 99%

Section: B Contributions Of the Proposed Approachmentioning

confidence: 99%

Section: ) Static DC Testingmentioning

confidence: 99%

Section: ) Static DC Testingmentioning

confidence: 99%

See 2 more Smart Citations

Prediction of analog performance parameters using fast transient testing

Variyam

Cherubal²,

Chatterjee

2002

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

227

116

View full text Add to dashboard Cite

show abstract

“…As shown in the literature [9][10][11][12], variation of any process or circuit parameter, such as width of a FET, value of a resistor, etc., in the process or circuit parameter space P affects the circuit specification S by a corresponding sensitivity factor. Let M be the space of measurements (voltage and current values) made on the circuit under test.…”

Section: Basic Conceptsmentioning

confidence: 99%

Automated test generation and test point selection for specification test of analog circuits

Halder

Chatterjee

SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)

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In this paper, a new automated test generation and concurrent test point selection algorithm for specification based testing of analog circuits is presented. The proposed approach co-optimizes the construction of a multi-tone sinusoidal test stimulus and the selection of the best set of test response observation points. The circuit specifications are predicted accurately from the test response using a prior algorithm. This prediction is based on a statistical regression based mapping of the test response waveform to the specifications of the circuit under test. The test generation and test point selection process tries to maximize the accuracy of specification prediction using the above mapping. Pass/fail test decisions are made using the predicted specifications. Simulation results show excellent performance of the proposed algorithms.

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Mixed-Signal Testing and DfT

Sunter¹

2006

Gizopoulos / Advances in ElectronicTesting

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Design based analog testing by characteristic observation inference

Abstract: In

Cited by 32 publications

References 14 publications

Prediction of analog performance parameters using fast transient testing

Prediction of analog performance parameters using fast transient testing

Automated test generation and test point selection for specification test of analog circuits

Mixed-Signal Testing and DfT

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