Mixed-Signal Testing and DfT

Sunter, Stephen

doi:10.1007/0-387-29409-0_9

Cited by 7 publications

(2 citation statements)

References 35 publications

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“…In the same purpose, some approaches have introduced the specification test compaction as described in [23] and [24] that leverages the correlation among specification tests in order to perform only a few of these tests during production and predict the values of the omitted ones to reduce test cost as well as the use of BIST techniques [25]. On the other hand, several methods based on the evaluation of test metrics are proposed in [26] and [27].…”

Section: Prior Workmentioning

confidence: 99%

A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters

et al. 2018

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Specifications of Radio Frequency (RF) analog integrated circuits have increased strictly as their applications tend to be more complicated and high test cost demanding. This makes them very expensive due to an increased test time and to the use of sophisticated test equipment. Alternative test measures, extracted by means of Built-In Self Test (BIST) techniques, are useful approaches to replace standard specification-based tests. One way to evaluate the efficiency of the CUT measures at the design stage is by estimating the Test Escapes (T E) and the Yield Loss (Y L) at ppm level. Unfortunately, an important number of Monte Carlo simulations must be run in order to guarantee their accuracy. For certain types of circuits, this requires many months or even years to generate millions of circuits. To overcome this limitation, we present in this paper a new technique where a small number of simulations is sufficient to reach an important precision. This method is based on a classification using machine learning methods, such as SVM and Neural Networks based classifiers to determine pass/fail regions. The proposed approach requires a few number of simulations only to determine the region separating the process parameters generating good and faulty, or pass and fail circuits. Then only this region is needed to estimate the test metrics without running any additional simulation. The proposed methodology is illustrated for the evaluation of a filter BIST technique. Keywords Analog/RF test • SVM classification • Neural Network classification • BIST evaluation 1 Introduction The test is a very important notion in the field of the validation step of analog circuit design. It is the way to confirm whether a circuit under test (CUT) satisfies all functional specifications that represent its performance parameters. Since there are no manufactured circuits at the design stage, test errors can only be

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Section: Prior Workmentioning

confidence: 99%

A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters

et al. 2018

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“…The current practice for testing the analog and mixed-signal (AMS) functions of ICs is specificationbased testing [1,2,3,4]. Specification-based testing involves direct measurement of the performances that are promised in the specification data sheet one by one.…”

Section: Introductionmentioning

confidence: 99%