Design of robust test criteria in analog testing

Abstract

Abstract

Prediction of analog performance parameters using fast transient testing

“…Although the testing methods in [1] and [31]- [34] can check if a circuit satisfies the specifications or not, these tests cannot be used to get any information about the performance parameters of the circuit. The test engineer has to decide about the quality of the product by looking at an abstract quantity such as a linear combination of the test measurements [1], [31]- [34].…”

“…The test engineer has to decide about the quality of the product by looking at an abstract quantity such as a linear combination of the test measurements [1], [31]- [34]. In the proposed testing method, the performance parameters of the CUT is predicted from the transient response of the CUT.…”

“…In [34], sensitivity-based approximations were used to derive alternate tests for linear analog circuits. In all the methods described above [1], [31]- [34], test decisions were made by looking at a linear combination of the test measurements. A linear combination of test measurements define a hyperplane in an dimensional space.…”

“…In [1] and [31], a set of dc and low-frequency test measurements were used to check for circuit specifications. In [32], white noise was used as an alternate test signal to test linear time invariant (LTI) analog circuits.…”

“…Thus, functional tests are performed repeatedly during the wafer probe, final test, stress test, and quality assurance test. This repeated performance of costly functional tests increases the production test cost of analog and mixed-signal products [1]- [4]. This paper presents a low-cost testing methodology that can replace costly functional testing.…”