Analog testing by characteristic observation inference

Lindermeir, W.M.; Graeb, Helmut; Antreich, K.J.

doi:10.1109/43.784126

Cited by 30 publications

(18 citation statements)

References 38 publications

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“…Specification-based ATPG techniques attempt to bridge the difference between traditional specification testing and faultbased testing by using alternate tests [12] or characteristic observations [13]. Here, testing is based on measurements that are inexpensive to perform compared with conventional specification tests.…”

Section: A Review Of Paradigms For Analog Testmentioning

confidence: 99%

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Voorakaranam¹,

Akbay

Bhattacharya

et al. 2007

IEEE Trans. Circuits Syst. I

102

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There are mainly two factors responsible for rapidly escalating production test costs of today's RF and high-speed analog circuits: 1) the high cost of high-speed and RF automatic test equipments and 2) long test times required by elaborate performance tests. In this paper, we propose a low-cost signature test methodology for accelerated production testing of analog and RF integrated circuits. As opposed to prior work, the key contribution of this paper is a new test generation algorithm that directly tracks the ability of input test waveforms to predict the test specification values from the observed test response, even in the presence of measurement noise. The response of the device-under-test (DUT) is used as a "signature" from which all of the performance specifications are predicted. The applied test stimulus is optimized in such a way that the error between the measured DUT performances and the predicted DUT performances is minimized. While existing low-cost test approaches have only been applied to lowand medium-frequency analog circuits, the proposed methodology extends low-cost signature testing to RF integrated circuits by incorporating modulation of a baseband test stimulus and subsequent demodulation of the obtained response to obtain the DUT signature. The proposed low-cost solution can be easily built into a load board that can be interfaced to an inexpensive tester.

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Section: A Review Of Paradigms For Analog Testmentioning

confidence: 99%

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Voorakaranam¹,

Akbay

Bhattacharya

et al. 2007

IEEE Trans. Circuits Syst. I

102

View full text Add to dashboard Cite

show abstract

“…The functional approach, or specification testing, accepts a circuit if all specifications are satisfied. The structural approach considers faults in the structure of the circuit and constructs test sets for detecting them based on measurements different from the specifications [1][2][3][4]. For implementing a functional test approach, it is necessary to determine if all the functional parameters of the circuit under test (CUT) are within the specifications reported by the vendor.…”

Section: Introductionmentioning

confidence: 99%

A low-cost configurability test strategy for an embedded analog circuit

Laprovitta

Peretti

Romero

et al. 2012

Microelectronics Journal

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“…Techniques for testing analogue circuits were presented in [12][13] [14][15] [16] [17], where it was shown and extensively applied that simulation, sensitivity, and other numerical and analytical methods can help in both analogue design and in analogue circuit testing. Compared to the analogue, digital and mixed-signal integrated circuits (ICs), less effort has been given to testing sensors, in particular, optical biosensors.…”

Section: Introductionmentioning

confidence: 99%

Parameter Modelling Approach with Potential Applications for Self-Test of Biosensors

Kadim

2008

2008 NASA/ESA Conference on Adaptive Hardware and Systems

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Establishing a relationship between the measurand and key parameters affecting the propagated light in a waveguide provides useful information for functional verification and testing of optical biosensors. The proposed mathematical model can estimate the expected responses which -independent of the sensor operation -can be compared against the measured responses to identify inconsistencies in the sensor performance. A noticeable drift in the estimated light intensity from that measured at the detector is an indication of abnormality in the sensor's functionality.

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Analog testing by characteristic observation inference

Cited by 30 publications

References 38 publications

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

A low-cost configurability test strategy for an embedded analog circuit

Parameter Modelling Approach with Potential Applications for Self-Test of Biosensors

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