A low-cost configurability test strategy for an embedded analog circuit

Laprovitta, Agustín Miguel; Peretti, Gabriela; Romero, Eduardo; Mourad, S.

doi:10.1016/j.mejo.2012.07.009

Cited by 7 publications

(7 citation statements)

References 11 publications

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“…The OAM addressed in this work is different from the one used in [14]. This can be clearly appreciated by simply comparing their full schematic diagrams, reported in [17,19] by the manufacturer.…”

Section: Testmentioning

confidence: 95%

“…It should be noted that the EACC addressed here has different structure and functionalities than the used in [14]. Additionally, the resources available on-chip for testing purposes are different, allowing some refinements in the test procedures.…”

Section: Journal Of Electrical and Computer Engineeringmentioning

confidence: 99%

“…These signals set three active modes: slow, medium, and fast. Additionally, unlike the OAM used in [14], the OA input dynamic range is also configurable here and the rail-to-rail input mode can be disabled, causing a significant reduction in OA quiescent current. The manufacturer provides further details of the module in [17].…”

Section: Oa Module Descriptionmentioning

confidence: 99%

“…For declaring a given test parameter as faulty, it is necessary to take into account both the device tolerances related to the fabrication process and the limiting error. Detailed information on the calculations required for determining the acceptance ranges for a similar case can be found in [14].…”

Section: Testmentioning

confidence: 99%

See 3 more Smart Citations

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Peretti

Romero

2014

Journal of Electrical and Computer Engineering

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This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability, safe operation, or fault tolerance characteristics. Our test proposal consists of programming a reduced set of available configurations for the EACC and testing its functionality by measuring only a few key parameters. The processor executes an embedded test routine that sequentially programs selected configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations. The test approach is experimentally evaluated using an embedded system-based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the circuit under test in a real application context by using a simple strategy at a very low cost.

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Section: Testmentioning

confidence: 95%

Section: Journal Of Electrical and Computer Engineeringmentioning

confidence: 99%

Section: Oa Module Descriptionmentioning

confidence: 99%

Section: Testmentioning

confidence: 99%

See 2 more Smart Citations

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Peretti

Romero

2014

Journal of Electrical and Computer Engineering

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“…Por eso algunas plataformas de sistemas en chip proveen EACCs capaces de implementar filtros, haciendo necesario contar con soluciones de test adecuadas para este tipo de circuitos. Una estrategia de test de bajo costo para filtros analógicos es el método de análisis de respuesta transitoria (TRAM, transient response analysis method) [7]. Este se basa en provocar al circuito bajo test (CUT, circuit under test) una respuesta en el tiempo subamortiguada y evaluar si sus atributos se encuentran dentro de rangos asociados a su operación nominal libre de fallas.…”

Section: Introductionunclassified

Propuesta de Test Funcional y Estructural para Filtros Analógicos Embebidos en Hardware Reconfigurable Basadas en Análisis de Respuesta Transitoria

Dri

Romero²,

Peretti³

2019

AJEA

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En este trabajo se presenta una estrategia de test basada en análisis de respuesta transitoria para filtros analógicos de capacidades conmutadas embebidos en dispositivos PSoC1 de Cypress® Semiconductor. La propuesta es de bajo costo y puede ser usada para mantenimiento en campo. La solución de test consiste en establecer bloques reconfigurables analógicos de PSoC1 como filtros pasabajos de segundo orden y evaluar su respuesta transitoria. El estímulo de entrada se genera internamente, mientras que la respuesta se procesa mediante un osciloscopio y posteriormente con una PC. Se demuestra experimentalmente que la estrategia es capaz de determinar especificaciones del filtro bajo test con bajo error y dispersión. Asimismo, es capaz de detectar en su totalidad fallas introducidas mediante reconfiguración de recursos del dispositivo. No obstante, para evaluar la capacidad de detectar fallas en componentes que no son accesibles para el usuario, se plantea un modelo de simulación de los circuitos bajo test. Los resultados preliminares señalan un buen grado de correlación entre el filtro real y el simulado, con y sin fallas.

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Fault detection in configurable switched-capacitor filters using transient analysis and dynamic time warping

Dri

Peretti

Romero

2021

Analog Integr Circ Sig Process

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A low-cost configurability test strategy for an embedded analog circuit

Cited by 7 publications

References 11 publications

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Propuesta de Test Funcional y Estructural para Filtros Analógicos Embebidos en Hardware Reconfigurable Basadas en Análisis de Respuesta Transitoria

Fault detection in configurable switched-capacitor filters using transient analysis and dynamic time warping

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