Measurement of the silicon (220) lattice spacing

Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty?

“…Our new set-up proved able to reduce systematic errors to a magnitude of 10 −9 d 220 and observations led us to confirm the d 220 value we gave previously [11]. This value should be compared with that reported in [7] for the PTB standard WASO 4.2A.…”

“…Figure 1 shows a diagram of the X-ray and optical interferometers. Since detailed descriptions of their operation and of the measurement procedure are reported elsewhere [6][7][8][9][10][11][12][13], we give here only a brief account. The lattice spacing is obtained by counting the number of (220) planes in a crystal portion of known length; for this an X-ray interferometer and a laser interferometer must be so coupled as to have the same baseline, along which a silicon crystal, which is a part of the X-ray interferometer known as the analyser, is moved orthogonally to the (220) planes.…”

A nano-metrology system with a two-dimensional combined optical and X-ray interferometer and an atomic force microscope

“…The X-ray interferometer, which was made from a nearly perfect Si (220) crystal, is a major instrument for precision measurement in a nano-scale measuring system (Basile et al 1994;Cavangnero et al 2004;Yacoot and Downs 2000;Yacoot and Cross 2003;Becker et al 1981). The periodic signal that is generated from an X-ray interferometer is about 0.192 nm.…”

Leading logarithmic corrections and uncertainty of Muonium hyperfine splitting calculations

“…The strong-interaction contribution is due to the hadronic vacuum Corrected as it is done in [2] b Corrected taking into account new values of the Sillicon lattice spacing [31,32] polarisation, a result of numerical evaluation is [14,34] …”