Measurement of relative permittivity of LTCC ceramic at different temperatures

Tan, Qiulin; Hao, Kun; Li, Qin; Xiong, Jijun; Zhou, Zhaoying; Zhang, Wendong; Luo, Tiejian; Chen, Xue; Liu, Jun

doi:10.1063/1.4867246

Cited by 13 publications

(6 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Because the working temperature of an RF cable is also typically limited up to 125 °C, 11,33,34,36) limitation in temperature is a common problem even in the conventional resonance methods. Though the use of antennas is one of the solutions for the limitation, 37) design of the thermal-static antennas should be a difficult process because the impedance of the antennas can be changed by changing temperature. The measurement accuracy was not as good as that of conventional resonance methods.…”

Section: Benefits and Limitations Of The Measurement Techniquementioning

confidence: 99%

Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies

Sakamaki

Hirano

Horibe

2021

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

In this study, we demonstrate the temperature dependence of the dielectric properties of Al 2 O 3 and Ba 2 Ti 9 O 20 ceramics, using a probe-backside reflection (PBR) method, at frequencies range up to 320 GHz. The impact of transmission loss on the dielectric properties was first eliminated from the measured S-parameter values using the original S-parameter values of a transmission line. Although the temperature coefficient of dielectric permittivity was uncertain owing to limitations in the measurement repeatability of the PBR method, those of loss tangents of Al 2 O 3 and Ba 2 Ti 9 O 20 ceramics were calculated as 2.8 × 10 −5 K −1 and 1.1 × 10 −4 K −1 , respectively, for frequencies up to 125 GHz. Furthermore, the temperature coefficient of the dielectric permittivity of Al 2 O 3 was calculated as 691 ppm K −1 at 255 GHz, while those of the dielectric loss tangent at 235 GHz and 275 GHz was calculated as 1.2 × 10 −5 K −1 and 1.5 × 10 −5 K −1 , respectively.

show abstract

Section: Benefits and Limitations Of The Measurement Techniquementioning

confidence: 99%

Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies

Sakamaki

Hirano

Horibe

2021

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

show abstract

“…Through Equations (2) and (3), it can be concluded that the resonant frequency of the sensor is affected by the relative permittivity of the dielectric material. The dielectric constant of the alumina ceramic material increases with the increasing temperature [ 25 , 26 ], causing the resonant frequency of the temperature sensor to decrease.…”

Section: Working Principle Of the Temperature Sensormentioning

confidence: 99%

Substrate Integrated Waveguide (SIW)-Based Wireless Temperature Sensor for Harsh Environments

Tan

Guo

Zhang

et al. 2018

Sensors

Self Cite

View full text Add to dashboard Cite

This paper presents a new wireless sensor structure based on a substrate integrated circular waveguide (SICW) for the temperature test in harsh environments. The sensor substrate material is 99% alumina ceramic, and the SICW structure is composed of upper and lower metal plates and a series of metal cylindrical sidewall vias. A rectangular aperture antenna integrated on the surface of the SICW resonator is used for electromagnetic wave transmission between the sensor and the external antenna. The resonant frequency of the temperature sensor decreases when the temperature increases, because the relative permittivity of the alumina ceramic increases with temperature. The temperature sensor presented in this paper was tested four times at a range of 30–1200 °C, and a broad band coplanar waveguide (CPW)-fed antenna was used as an interrogation antenna during the test process. The resonant frequency changed from 2.371 to 2.141 GHz as the temperature varied from 30 to 1200 °C, leading to a sensitivity of 0.197 MHz/°C. The quality factor of the sensor changed from 3444.6 to 35.028 when the temperature varied from 30 to 1000 °C.

show abstract

“…In this respect, the resonator method with planar circuits, such as stripline and ring resonators, can be used for investigating inhomogeneity because they can provide the dielectric property of a circuit substrate around the resonator fabricated on the substrate. [22][23][24][25] The length of a λ=2 resonator at 100 GHz is 1.5 mm; thus, the stripline resonator method can realize local dielectric measurement at a resolution of several millimeters. Furthermore, the dielectric permittivity of a transmission line whose length is precisely known can be approximately estimated based on the phase of the transmission coefficient in a simple manner.…”

Section: Introductionmentioning

confidence: 99%

Demonstration of in-situ dielectric permittivity measurement using precision probing technique

Sakamaki

Horibe

Tsurumi

2018

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

This paper proposes a breakthrough in-situ dielectric permittivity measurement technique for a circuit substrate with various planar circuits on the substrate. The proposed technique uses a quasi-resonator at the backside of an RF probe, which is contacted at the middle of the feed line of the planar circuits. Dielectric permittivity is calculated using the difference between the resonance frequencies of two measurements with different probe-contact positions. The proposed technique can be used for the feed lines of a matched-transmission line and an attenuator. Therefore, it can be used for the evaluation of circuit substrates with various devices. The proposed technique can realize the in-situ dielectric measurement of circuit substrates, and it is expected to be a powerful tool for the investigation of the defects in practical RF devices because it does not require any resonator for a device under test.

show abstract

Measurement of relative permittivity of LTCC ceramic at different temperatures

Cited by 13 publications

References 10 publications

Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies

Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies

Substrate Integrated Waveguide (SIW)-Based Wireless Temperature Sensor for Harsh Environments

Demonstration of in-situ dielectric permittivity measurement using precision probing technique

Contact Info

Product

Resources

About