Abstract:We consider QCD corrections to Higgs boson production through gluon-gluon fusion in hadron collisions. Using the recently evaluated [14] two-loop amplitude for this process and the corresponding factorization formulae [15]-[18] describing soft-gluon bremsstrahlung at O(α 2 S ), we compute the soft and virtual contributions to the next-to-next-to-leading order cross section. We also discuss soft-gluon resummation at next-to-next-to-leading logarithmic accuracy. Numerical results for Higgs boson production at th… Show more
“…The film mass change on the QCM crystal can be monitored by a QCM controller (ULVAC-CRTM9000). The mass resolution of the QCM system is 2.4×10 −11 g. With this QCM system, we have measured sputtering yields of Au [8] and magnesium oxide (MgO) [9,10] by He, Ne, Ar, Kr, or Xe ion beams and found that the measured sputtering yields agree well with earlier data obtained by other experimental groups.…”
Interactions of indium (In) and silicon (Si) atoms have been found to catalyze certain organic chemical reactions with high efficiency. In a recent paper [S. Yoshimura, et al., Appl. Surf. Sci., 257, 192 (2010)], it has been demonstrated that an In injected SiO2 thin film formed under specific ion beam conditions catalyzes a reaction of benzhydrol with acetylacetone. In this study a technique to implant bismuth (Bi) ions into SiO2 thin films has been developed with highly controlled ion doses and injection energies for the formation of thin films that promote Bi(III) catalysis in organic chemistry. For this purpose, the Freeman-type ion source of our beam system was modified with a new sputtering target. In addition, sticking probabilities of Bi have been obtained with the use of a quartz crystal microbalance. Although efficiency of catalytic reactions by a Bi implanted SiO2 thin film is yet to be improved, the technique provides a Bi-Si based novel catalyst of a thin film type.
“…The film mass change on the QCM crystal can be monitored by a QCM controller (ULVAC-CRTM9000). The mass resolution of the QCM system is 2.4×10 −11 g. With this QCM system, we have measured sputtering yields of Au [8] and magnesium oxide (MgO) [9,10] by He, Ne, Ar, Kr, or Xe ion beams and found that the measured sputtering yields agree well with earlier data obtained by other experimental groups.…”
Interactions of indium (In) and silicon (Si) atoms have been found to catalyze certain organic chemical reactions with high efficiency. In a recent paper [S. Yoshimura, et al., Appl. Surf. Sci., 257, 192 (2010)], it has been demonstrated that an In injected SiO2 thin film formed under specific ion beam conditions catalyzes a reaction of benzhydrol with acetylacetone. In this study a technique to implant bismuth (Bi) ions into SiO2 thin films has been developed with highly controlled ion doses and injection energies for the formation of thin films that promote Bi(III) catalysis in organic chemistry. For this purpose, the Freeman-type ion source of our beam system was modified with a new sputtering target. In addition, sticking probabilities of Bi have been obtained with the use of a quartz crystal microbalance. Although efficiency of catalytic reactions by a Bi implanted SiO2 thin film is yet to be improved, the technique provides a Bi-Si based novel catalyst of a thin film type.
“…For example, experimentally obtained MgO sputtering yield data for He and Ar ion injections in the energy range below about 500 eV have been presented recently by the authors of this article [2]. Other experimentally measured sputtering yields of MgO by low-energy noble gas ions that we are aware of are only those presented in Refs.…”
Section: Introductionmentioning
confidence: 83%
“…[5] do not agree with published experimental data of Refs. [2][3][4]. No experimentally measured or theoretically estimated MgO sputtering yields by Kr ion bombardment in the low-energy range seem to have been reported so far.…”
“…Sputter yields of Mg from MgO by low-energy He and Ar ion beams were measured as a function of ion energy by Hine et al (2007) and fit to the following equations:…”
Section: Ion Sputtering At the Time Of M2mentioning
a b s t r a c tFrom observations of the metallic species sodium (Na), potassium (K), and magnesium (Mg) in Mercury's exosphere, we derive implications for source and loss processes. All metallic species observed exhibit a distribution and/or line width characteristic of high to extreme temperature -tens of thousands of degrees K. The temperatures of refractory species, including magnesium and calcium, indicate that the source process for the atoms observed in the tail and near-planet exosphere are consistent with ion sputtering and/or impact vaporization of a molecule with subsequent dissociation into the atomic form. The extended Mg tail is consistent with a surface abundance of 5-8% Mg by number, if 30% of impact-vaporized Mg remains as MgO and half of the impact vapor condenses. Globally, ion sputtering is not a major source of Mg, but locally the sputtered source can be larger than the impact vapor source. We conclude that the Na and K in Mercury's exosphere can be derived from a regolith composition similar to that of Luna 16 soil (or Apollo 17 orange glass), in which the abundance by number is 0.0027 (0.0028) for Na and 0.0006 (0.0045) for K.Published by Elsevier Inc.
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