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2008
DOI: 10.1016/j.tsf.2008.08.127
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Experimental evaluation of MgO sputtering yields by monochromatic Ne, Kr, or Xe ion beams

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Cited by 33 publications
(24 citation statements)
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“…The film mass change on the QCM crystal can be monitored by a QCM controller (ULVAC-CRTM9000). The mass resolution of the QCM system is 2.4×10 −11 g. With this QCM system, we have measured sputtering yields of Au [8] and magnesium oxide (MgO) [9,10] by He, Ne, Ar, Kr, or Xe ion beams and found that the measured sputtering yields agree well with earlier data obtained by other experimental groups.…”
Section: Methodssupporting
confidence: 79%
“…The film mass change on the QCM crystal can be monitored by a QCM controller (ULVAC-CRTM9000). The mass resolution of the QCM system is 2.4×10 −11 g. With this QCM system, we have measured sputtering yields of Au [8] and magnesium oxide (MgO) [9,10] by He, Ne, Ar, Kr, or Xe ion beams and found that the measured sputtering yields agree well with earlier data obtained by other experimental groups.…”
Section: Methodssupporting
confidence: 79%
“…Results in agreement with those just mentioned can also be observed for 3D porous scaffolds (Table 2); a lower magnesium content in comparison with the corresponding flat samples can be noted, which is closely related to the analytical problems that the morphology and structure of these porous samples can cause. The different outcomes obtained by varying the feed composition are attributable to the impact of the latter on the RF sputter process from the MgO target, which is known to affect the sputtering yield [37][38][39][40][41]. It is possible to conclude that under the experimental conditions used in this work, H 2 O feed shows a lower capacity than Ar and Ar/H 2 O to sputter Mg from the target, while the H 2 feed exhibits a higher ability to sputter the same material compared with Ar and Ar/H 2 mixtures.…”
Section: Chemical and Physical Characterization Of Pcl Flat Samples Amentioning
confidence: 99%
“…As a result, a decrease in the sputter rate can occur because the binding energy of the compounds is much higher than that of pure metals. On the contrary, when H 2 is used as a reactive gas, it can promote the etching of the oxygen present on the target and the formation of metallic Mg, which can be easily sputtered due to its higher sputter rate compared to MgO [37][38][39][40][41]. In fact, after the sputtering process performed with H 2 , the color of the target's surface turns grayish, which is indicative of the formation of metallic Mg.…”
Section: Chemical and Physical Characterization Of Pcl Flat Samples Amentioning
confidence: 99%
“…The mass resolution of the QCM system is 2.4×10 −11 g. For details of the measurement system, the reader is referred to Ref. [20]. With this system, we have measured sputtering yields of MgO [20] and Au [21] by He, Ne, Ar, Kr, and Xe ion beams.…”
Section: B Gallium Ion Beam Experimentsmentioning
confidence: 99%