Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

杨家敏,; 甘新式,; 赵阳,; 崔明启,; 朱托,; 赵屹东,; 孙丽绢,; 郑雷,; 鄢芬,; 胡智民,; 韦敏习,; 张继彦,; 易荣清,

doi:10.1088/1674-1056/20/1/010705

Cited by 5 publications

(1 citation statement)

References 17 publications

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“…The in situ high-pressure angle-dispersive XRD measurements were conducted at beamline 4W2 of the Beijing Synchrotron Radiation Facility. [28] The x-ray wavelength is 0.6199 Å. For better comparison with the measurements of the electrical transport properties, no pressure-transmitting medium was loaded.…”

Section: Experimental Methodsmentioning

confidence: 99%

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*

Wang

Shen

et al. 2019

Chinese Phys. B

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The electrical transport properties and structures of Y2O3/ZrO2 solid solution have been studied under high pressure up to 23.2 GPa by means of in situ impedance spectroscopy and x-ray diffraction (XRD) measurements. In the impedance spectra, it can be found that the pressure-dependent resistance of Y2O3/ZrO2 presents two different change trends before and after 13.3 GPa, but the crystal symmetry still remains stable in the cubic structure revealed by the XRD measurement and Rietveld refinement. The pressure dependence of the lattice constant and unit cell volume shows that the Y2O3/ZrO2 solid solution undergoes an isostructural phase transition at 13.1 GPa, which is responsible for the abnormal change in resistance. By fitting the volume data with the Birch–Murnaghan equation of state, we found that the bulk modulus B 0 of the Y2O3/ZrO2 solid solution increases by 131.9% from 125.2 GPa to 290.3 GPa due to the pressure-induced isostructural phase transition.

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Section: Experimental Methodsmentioning

confidence: 99%

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*

Wang

Shen

et al. 2019

Chinese Phys. B

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Calibration of X-ray spectrometers for opacity experiments at the Orion laser facility (invited)

Bentley

Allan

Brent

et al. 2016

Review of Scientific Instruments

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Accurately calibrated and characterised x-ray diagnostics are a key requirement in the fielding of experiments on the Orion laser where absolute measurements of x-ray emission are used to underpin the validity of models of emissivity and opacity. Diffraction crystals are used in spectrometers on Orion to record the dispersed spectral features emitted by the laser produced plasma to obtain a measurement of the plasma conditions. The ability to undertake diffraction crystal calibrations supports the successful outcome of these Orion experiments. This paper details the design and commissioning of a system to undertake these calibrations in the energy range 2.0 keV to approximately 8.5 keV. Improvements to the design are detailed which will extend the commissioned range of energies to below 1 keV.

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Flat Crystal x-ray Spectrometer for Quantitative Spectral Measurement in the 2–5 keV Region

Zhao¹,

Wei²,

Deng³

et al. 2011

Chinese Phys. Lett.

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A technique of flat crystal x-ray spectrometer for quantitative spectral measurement is described. For the flat crystal spectrograph geometry, the quantitative reduction of relating the CCD counts back to the photon flux from the x-ray source is established. The absolute calibrations of the integral diffraction coefficients of the crystal and the CCD sensitivity make it possible to measure absolute photons flux within the energy range of 2000-5000 eV. The uncertainty analysis of the calibrations is carried out to obtain the energy resolved uncertainties of crystal and CCD. Thus, the experimental spectra with spectral resolved intensity uncertainties are available. Then, a performing experiment of laser-produced Ti plasma is carried out and the absolute x-ray spectra with intensity uncertainty less than 8.5% are obtained. The technique is promising for absolute spectral measurement of high temperature plasmas in a kilo-electron-volt region.

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Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

Abstract: Yang Jia-Min(杨家敏) a) † , Gan Xin-Shi(甘新式) a) , Zhao Yang, Wei Min-Xi(韦敏习) a) , Zhang Ji-Yan(张继彦) a) , and Yi Rong-Qing(易荣清) a)

Cited by 5 publications

References 17 publications

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*

Calibration of X-ray spectrometers for opacity experiments at the Orion laser facility (invited)

Flat Crystal x-ray Spectrometer for Quantitative Spectral Measurement in the 2–5 keV Region

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Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

Abstract: Yang Jia-Min(杨家敏) a) † , Gan Xin-Shi(甘新式) a) , Zhao Yang, Wei Min-Xi(韦敏习) a) , Zhang Ji-Yan(张继彦) a) , and Yi Rong-Qing(易荣清) a)

Cited by 5 publications

References 17 publications

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO2 solid solution*

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO2 solid solution*

Calibration of X-ray spectrometers for opacity experiments at the Orion laser facility (invited)

Flat Crystal x-ray Spectrometer for Quantitative Spectral Measurement in the 2–5 keV Region

Contact Info

Product

Resources

About

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*

Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO₂ solid solution*