2011
DOI: 10.1088/0256-307x/28/6/060701
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Flat Crystal x-ray Spectrometer for Quantitative Spectral Measurement in the 2–5 keV Region

Abstract: A technique of flat crystal x-ray spectrometer for quantitative spectral measurement is described. For the flat crystal spectrograph geometry, the quantitative reduction of relating the CCD counts back to the photon flux from the x-ray source is established. The absolute calibrations of the integral diffraction coefficients of the crystal and the CCD sensitivity make it possible to measure absolute photons flux within the energy range of 2000-5000 eV. The uncertainty analysis of the calibrations is carried out… Show more

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Cited by 4 publications
(2 citation statements)
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“…We also measure the X-ray signal with our HOPG spectrometer for comparison. Since the diffraction efficiency of HOPG crystal is higher than that of PET crystal [14,15] , it is necessary to reduce laser energy and intensity to protect the CCD. The laser intensity is set as 10 14 W/cm 2 , and the total delivery energy is 80 J within duration of 1 ns.…”
Section: The Experimental Results and Discussionmentioning
confidence: 99%
“…We also measure the X-ray signal with our HOPG spectrometer for comparison. Since the diffraction efficiency of HOPG crystal is higher than that of PET crystal [14,15] , it is necessary to reduce laser energy and intensity to protect the CCD. The laser intensity is set as 10 14 W/cm 2 , and the total delivery energy is 80 J within duration of 1 ns.…”
Section: The Experimental Results and Discussionmentioning
confidence: 99%
“…2 were obtained by using the technique of flat crystal x-ray spectrometry for quantitative spectral measurement. [8] The uncertainty of the intensity was below 8.5%. Between 2.60 and 2.64 Å, the He-like resonance (1𝑠2𝑝 1 𝑃 1 -1𝑠 2 1 𝑆 0 ), intercombination (1𝑠2𝑝 3 𝑃 1 -1𝑠 2 1 𝑆 0 ) lines and the Li-like satellites were clearly resolved.…”
mentioning
confidence: 91%