Computer simulations of differential scanning calorimetry (DSC) are presented based on an electrical equivalent-circuit model. The Influence of variables Including heating rate, sample mass, and thermal resistance factors on the DSC peak shape, and associated peak parameters, was simulated. Melting was chosen as a test thermal transition for this purpose. The application of simplex optimization to the peak resolution problem In DSC Is described for the first time. This methodology Is Illustrated for two test cases involving the melting of a two-component mixture.Computer simulation offers a powerful route to testing the influence of parametric variables which are not easily amenable to experimental control by the analytical chemist. A case in point concerns thermal resistances in a differential scanning calorimetry (DSC) cell. The thermal resistances of the major heat-flow paths in a DSC cell are recognized to be crucial to the performance of this analytical technique (1); however, a systematic evaluation of their influence on DSC peak shapes presents many experimental problems. In a previous paper, an equivalent-circuit model was presented for a DSC cell of the heat-flux type (2). This model was subsequently utilized to guide the development of a DSC peak resolution-enhancement methodology based on the use of He as a purge gas (3). This paper details further refinement of this model, and its application to computer simulations of a DSC scan.In particular, the model and simulations were used to probe the influence of thermal resistances on peak area, amplitude, onset temperature, and resolution.A second objective of this study was to explore the applicability of the simplex optimization technique (4) to DSC. The simplex technique is applied, we believe, for the first time, to the optimization problem involving the resolution of overlapping DSC peaks. Overlapping DSC peaks are usually resolved by decreasing either the sample mass, the heating rate, or both. Obviously, selection of an optimal combination