Measurement of exo‐electron emission from MgO thin film of ACPDPs

Yoon, Sang‐Hoon; Hong, Cho-Rong; Ko, Jae Wook; Yang, Heesun; Kim, Yong-Seog

doi:10.1889/jsid17.2.131

Cited by 15 publications

(11 citation statements)

References 12 publications

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“…The exo-electron currents were measured by attaching a current sensor to the address electrodes, of which details can be found elsewhere. 10 As noted in Fig. 3, the exo-electron currents were measured to increase with the number of sustaining cycles.…”

Section: Effects Of Trapped Electron Concentrationmentioning

confidence: 77%

“…11 First of all, in this model a fraction of the trapped electrons at shallow trap levels located beneath the conduction band edge of MgO are thermally excited to the conduction band. The trap levels in MgO film have been estimated or measured 10,12 to be in the range of 0.1-0.5 eV. Therefore, the direct excitation of such trapped electrons above vacuum level by the thermal excitation process has been all but ruled out in this study because they have to overcome an energy barrier that consists of the trap energy plus the electron affinity of MgO (~0.8 eV).…”

Section: A Theoretical Model For Exo-electron Emission and Experimentmentioning

confidence: 96%

“…When the electron-trapping levels are mostly occupied, the recombination reaction between the thermally excited electrons and the trapped holes would become the predominant reaction. The rate of thermal excitation of the trapped electrons is given by (10) Integrating Eq. (10) yields,…”

Section: Exo-electron-emission Model Considering the Wall Charge Of Amentioning

confidence: 99%

“…Thus, by combining Eqs. (7), (8), (10), and (11), the exoelectron currents ejected into vacuum space, I 0 exo , is given by…”

Section: Exo-electron-emission Model Considering the Wall Charge Of Amentioning

confidence: 99%

“…Among various potential sources for the seed electrons, exo-electrons emitted from MgO thin film have been identified as the primary source for ACPDPs. [7][8][9][10] The exoelectrons are usually emitted during relaxation processes of electronic defects in dielectric materials and have pertinent current density and decay time required for ACPDPs. Experimental measurements of exo-electron currents in the minuscule discharge cells of ACPDPs were made possible only after revelation of the measuring scheme by Yan and co-workers.…”

Section: Introductionmentioning

confidence: 99%

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Parameters influencing exo‐electron emission currents from MgO film of ACPDPs

2010

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Abstract— A theoretical model of exo‐electron emission kinetics was developed by considering back‐diffusion and the gas‐amplification phenomena. Using the model, the effects of temperature, trapped electron concentration, trap energy level, and trap concentration on the exo‐electron currents were predicted and compared with experimental results. The theoretically predicted values agreed reasonably well with the trends of the measured results.

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Section: Effects Of Trapped Electron Concentrationmentioning

confidence: 77%

Section: A Theoretical Model For Exo-electron Emission and Experimentmentioning

confidence: 96%

Section: Exo-electron-emission Model Considering the Wall Charge Of Amentioning

confidence: 99%

“…Thus, by combining Eqs. (7), (8), (10), and (11), the exoelectron currents ejected into vacuum space, I 0 exo , is given by…”

Section: Exo-electron-emission Model Considering the Wall Charge Of Amentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Parameters influencing exo‐electron emission currents from MgO film of ACPDPs

2010

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Decay kinetics of luminescence and electron emission from MgO crystal powders in ac plasma display panels

Okada

Naoi

Yoshioka

2009

Journal of Applied Physics

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Decay kinetics of luminescence at 5.2 eV and those of sustained electron emission from MgO crystal powders were investigated in order to understand the mechanism of discharge delay in ac plasma display panels and sustained electron emission from insulator. The decay of UV-luminescence was nonexponential and the decay was enhanced by increasing the temperature after showing negligible temperature dependence at low temperature. Existence of carrier traps was indicated by thermoluminescence measurements. As a possible mechanism, luminescence from a donor-acceptor pair in combination with thermal activation from carrier traps was introduced. The electron emission properties were evaluated by the measurement of statistical discharge delay time in ac plasma display panels as an indicator. By coating MgO crystal powders on the MgO protective film, the intensity of electron emission increased and its time and temperature dependence was reduced. A comparison under the same excitation revealed that the decay of UV-luminescence was steeper than that of electron emission. To explain the experimental data, we proposed the involvement of direct electron emission from electron traps synchronized with measuring voltages in addition to luminescence-associated electron emission.

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Wall charge evolution models and emission of exoelectrons from MgO thin film of ac-PDPs

Kim

Yoon

Yang

2010

Journal of Applied Physics

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Two different wall charge evolution models, i.e., reversion and accumulation models, were proposed incorporating the phenomenon of secondary electron emission during the glow discharges of alternating current-PDPs. Based on the wall charge evolution models, theoretical analyses on exoelectron emission kinetics were conducted, and the effects of initial electron concentration trapped and temperature on the exoelectron currents were predicted. The theoretical prediction was compared with the currents measured experimentally. The theoretical analyses and experimental observations suggest that wall charge evolution model and the first- and second-order reaction kinetics may represent the wall charge formation and exoelectron emission from MgO layer of ac-PDPs.

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Measurement of exo‐electron emission from MgO thin film of ACPDPs

Cited by 15 publications

References 12 publications

Parameters influencing exo‐electron emission currents from MgO film of ACPDPs

Parameters influencing exo‐electron emission currents from MgO film of ACPDPs

Decay kinetics of luminescence and electron emission from MgO crystal powders in ac plasma display panels

Wall charge evolution models and emission of exoelectrons from MgO thin film of ac-PDPs

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