Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation

Ichikawa, Kouji; Takahashi, Yuki; Sakurai, Yasuhisa; Tsuda, T.; Iwase, Isao; Nagata, Makoto

doi:10.1093/ietele/e91-c.6.936

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Cited by 4 publications

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“…For example, it is reported the studies as for on-chip waveform monitors (OCM) [2]- [4] and the immunity of bandgap voltage references (BGR) [5]- [10]. There are a few studies of noise propagation paths on BGRs in mixed signal LSIs.…”

Section: Introductionmentioning

confidence: 99%

Noise analysis using on-chip waveform monitor in bandgap voltage references

Murata

Agatsuma

Ikoma

et al. 2013

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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In this paper, the susceptibility of a CMOS bandgap voltage reference (BGR) to external noise was investigated using an on-chip waveform monitor circuit in conjunction with circuit simulations. A Direct RF Power Injection method was employed for the immunity test of the BGR. Also, we evaluated the performance of the on-chip waveform monitor and analyze the BGR immunity using the on-chip monitor. As the results, we have clarified the mechanism of the BGR malfunction. The output voltage drop of the BGR was caused by the offset of operational amplifier in BGR.

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Section: Introductionmentioning

confidence: 99%