Ce9Fe91 films with different thickness were fabricated by a rf magnetron sputtering method. The critical thickness tc for spin reorientation transition has been determined to be approximately 90 nm using the stripe domain model and magnetic force microscope. Above tc, the films exhibit Bloch stripe domain structure and a superhigh resonance frequency at 6 GHz is found for the ∥ stripe configuration. However, below tc, the films possess an in‐plane uniaxial anisotropy caused by order interface tension between the film and substrate, and the resonance frequency breaks through the Snoek limit.