The Effect of Substrate Temperature on Magnetic and Electrical Properties of (CeO2)14Fe86 Films

Abstract

CeO 2 ) 14 Fe 86 films were fabricated by a radio frequency magnetron sputtering method at different substrate temperature. The results reveal that the films deposited at substrate temperature lower than 773 K exhibit a strong perpendicular anisotropy, and the correlated dynamic permeability spectrum measured over the frequency range of 0.5-7 GHz shows a high resonance frequency. The study on the relation R ∼ T shows that the resistivity of the thin film has a minimum near room temperature and tends to saturation as the temperature approaches zero, exhibiting a behavior reminiscent of Kondo scattering. However, as the substrate temperature increases to 973 K, the films possess an in-plane anisotropy and lower H c . The resistivity exhibits a transition from metal to insulator characterized by a maximum of resistivity at 220 K.