1996
DOI: 10.1117/12.255155
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<title>Improved HgCdTe detectors with novel antireflection coating</title>

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Cited by 3 publications
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“…As to investigations of noise mechanisms in HgCdTe photodiodes the origin of the 1/f noise still seems to be the most important and unsolved problem. Several sources of the 1/f noise have been proposed in application to these photodiodes [10][11][12][13][14][15]. One of the possible source is lattice defects of different types unintentionally or intentionally introduced during growth of starting material.…”
Section: Introductionmentioning
confidence: 99%
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“…As to investigations of noise mechanisms in HgCdTe photodiodes the origin of the 1/f noise still seems to be the most important and unsolved problem. Several sources of the 1/f noise have been proposed in application to these photodiodes [10][11][12][13][14][15]. One of the possible source is lattice defects of different types unintentionally or intentionally introduced during growth of starting material.…”
Section: Introductionmentioning
confidence: 99%
“…As shown in [12], 1/f noise in LWIR photodiodes is a bulk phenomenon associated with defects in the depletion region. However, the states at the interface of HgCdTe and passivating layer can also contribute to 1/f noise [11,13,14]. Finally, the dark current is suspected to be a possible source of 1/f noise, too.…”
Section: Introductionmentioning
confidence: 99%
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