2005
DOI: 10.1063/1.1868065
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Low temperature internal friction in nanocrystalline diamond films

Abstract: Measurements of the temperature dependence of the internal friction and frequency of three nanocrystalline diamond films grown on silicon oscillator substrates indicate that the mechanical properties of the films are dominated by their interface layers. The films, with thicknesses of 0.3, 0.6, and 1.14μm, were measured between 0.4K and room temperature and have low temperature (below 10K) internal frictions between 2×10−6 and 5×10−6, which is an order of magnitude lower than has been reported previously. Addit… Show more

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Cited by 19 publications
(14 citation statements)
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“…The internal friction of the nanocrystalline diamond film is attributed to a highly disordered interfacial layer between the film and silicon substrate, where the internal friction could be even higher than in its amorphous counterpart. 32 Thus, for most of the thickness above the interfacial layer, we could infer that the internal friction may indeed be much smaller.…”
Section: Resultsmentioning
confidence: 95%
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“…The internal friction of the nanocrystalline diamond film is attributed to a highly disordered interfacial layer between the film and silicon substrate, where the internal friction could be even higher than in its amorphous counterpart. 32 Thus, for most of the thickness above the interfacial layer, we could infer that the internal friction may indeed be much smaller.…”
Section: Resultsmentioning
confidence: 95%
“…2, together with a DPO carrying a nanocrystalline diamond film deposited by chemical vapor deposition. 32 The solid line labeled "background" is the internal friction of a bare DPO, Q sub −1 , used in Eq. ͑2͒.…”
Section: Resultsmentioning
confidence: 99%
“…45 Dissipation in ta-C indicated the processes dominated by two-level tunneling states ͑TLS͒. 11 Recent investigation 36 of the quality factor of metalcoated UNCD fixed-fixed beams at extremely low temperatures ͑Ͻ10 K͒ indicated the presence of TLS processes. Table II summarizes the results reported by other groups [9][10][11]24,44,45 as compared to ours for different flexural beams fabricated using NCD, UNCD, or ta-C films.…”
Section: Dissipation In Diamondmentioning
confidence: 99%
“…Measurements on these traditional UNCD were performed using nanoindentation ͑864 GPa͒ 5 and cantilever beam deflection ͑916-959 GPa͒. 4 However, MPCVD-grown NCD fixed-fixed resonator structures yielded Young's modulus values ranging from 680-980 GPa, [9][10][11] and MPCVD-grown UNCD fixed-fixed resonators grown at 550°C yielded a modulus of 710 GPa. 2 The reasons for the somewhat lower Young's modulus of the UNCD films studied here compared to MPCVD grown traditional UNCD films discussed are not understood at this time.…”
Section: A Young's Modulusmentioning
confidence: 99%
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