1998
DOI: 10.1109/68.651082
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Low resistance intracavity-contacted oxide-aperture VCSELs

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Cited by 50 publications
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“…The presented scheme can be further integrated to yield electrically pumped plasmon enhanced TPE by employing lateral injection techniques, similar to those used in oxide aperture vertical-cavity surface-emitting lasers. 21 TPE spectrum from a semiconductor is calculated by a second-order term in the time-dependent perturbation theory 13 …”
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confidence: 99%
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“…The presented scheme can be further integrated to yield electrically pumped plasmon enhanced TPE by employing lateral injection techniques, similar to those used in oxide aperture vertical-cavity surface-emitting lasers. 21 TPE spectrum from a semiconductor is calculated by a second-order term in the time-dependent perturbation theory 13 …”
mentioning
confidence: 99%
“…The presented scheme can be further integrated to yield electrically pumped plasmon enhanced TPE by employing lateral injection techniques, similar to those used in oxide aperture vertical-cavity surface-emitting lasers. 21 TPE spectrum from a semiconductor is calculated by a second-order term in the time-dependent perturbation theory 13 where pω 0 is the energy of the one-photon transition, D(ω) the density of radiation modes, and the summation over carrier states takes into account the electron density of states and the Fermi-Dirac distributions. M, the matrix element for the transition, is given by where e is the electron charge, m 0 the free electron mass, V the field quantization volume, and M′ the dimensionless matrix element for the second-order process where p is the momentum operator, ε b the photon field, Γ the charge-carrier dephasing rate, 12 and E m the energy of the electron state m, with m being one of i, n, and f, standing for initial, intermediate, and final states, respectively.…”
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“…However, the oxide confinement method increases the differential resistance of the device, which needs the same current injection carriers under the higher bias, which also induces the impendence mismatch to degrade the data transmission 25 . Therefore, the high-doping zincdiffusion technology was used to improve the resistance of p-type layer for VCSELs, which further decreases the free-carrier absorption to enhance the quantum efficiency of the VCSEL 26,27 29 .…”
Section: Vcselmentioning
confidence: 99%
“…By reducing the diameter of oxide-confined aperture, the allowable area of mode field and characteristic frequency of the VCSEL are confined to avoid the generation of high-order transverse modes, which strategically decreases the lasing mode number for delivering the FM VCSEL at some sacrifice of output power [10]. Unfortunately, as the oxide-confined aperture becomes smaller, the differential resistance of the VCSEL would inevitably increase to degrade the modulation depth under data modulating [11]. To solve this problem, a high-doping zinc-diffusion fabrication was considered to be added to the top distributed Bragg reflector (DBR) to improve the ohmic contact by reducing the mirror resistance through the suppression of free carrier absorption [12][13][14].…”
Section: Introductionmentioning
confidence: 99%