Low Incidence X‐Ray Goniometry for Thin Films Texture Analysis

Discrimination and detection limits of secondary phases in Cu2ZnSnS4 using X-ray diffraction and Raman spectroscopy

“…In summary, the presented results agree with the general findings of Bolle and Heizmann, which discuss for thin films with layered structure as well as for homogeneous thin films, that a standard quantification procedure using Rietveld refinement methods generally fails [34,35]. A qualitative identification of ZnS in a majority CZTS film, however, is possible if more than 10 % of the films consist of ZnS.…”

X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: application to brass coating

“…The integrated subintensity J i of the ith segment, when one takes into account the absorption of the incident and diffracted beams by all the segments and layers located above it, can be written (Heizmann et al, 1988) …”