X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: application to brass coating

Abstract

Using the Houska method based on X-ray diffractionline pro®le analysis, new mathematical treatments are proposed to compute directly the concentration depth pro®le of thin ®lms obtained by diffusion. As an example, concentration depth pro®les of a brass layer have been studied during the thermal diffusion process. This nondestructive method is fast (a few minutes) and allows the sample to be used for complementary analysis if necessary.

Structure and composition heterogeneity of a FeAl alloy prepared by one-step synthesis and consolidation processing and their influence on grain size characterization

“…Compared with the effect of the heterogeneity of Al content on the DPPA analysis of the thermally sprayed FeAl coatings [19], the contribution of this heterogeneity of Al content to the X-ray diffraction peak broadening is more pronounced in the present work as the MAFAPAS synthesized material is lack of dislocations and subgrains. Boll et al [27] have already proposed a mathematical treatment by analyzing X-ray diffraction line profile to obtain information about concentration depth profiles for thin films of binary alloys. However, this method was established under conditions assuming that the variation of the inter-planar spacing with concentration is known and the variation of the concentration must be continuous.…”