2006
DOI: 10.2478/s11772-006-0020-2
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Low-frequency noises as a tool for UV detector characterisation

Abstract: Ultraviolet (UV) semiconductor detectors are mainly made of materials with wide energy gap, i.e., of AlGaN, GaP, SiC, and diamond. The article describes methodology of measurements of characteristics of low-frequency noises of UV detectors and presents the developed measuring system. Basing on analysis of noise characteristics of detectors, an optimal working point of detector can be determined. The results of measurements of noise characteristics of UV detectors made of AlGaN are shown. The measurements have … Show more

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Cited by 3 publications
(2 citation statements)
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“…LFNS was used in the investigations of e.g. semiconductor materials and devices [19], UV detectors [20], gas sensors [21] and TFRs [6-8, 10, 11]. This method examines the evolution of low-frequency noise spectrum as a function of temperature.…”
Section: Low-frequency Noise Spectroscopymentioning
confidence: 99%
“…LFNS was used in the investigations of e.g. semiconductor materials and devices [19], UV detectors [20], gas sensors [21] and TFRs [6-8, 10, 11]. This method examines the evolution of low-frequency noise spectrum as a function of temperature.…”
Section: Low-frequency Noise Spectroscopymentioning
confidence: 99%
“…-decrease in thermal noise of load resistance (using high R L values and in some applications additional decrease in detector operation temperature), -use of the optimised ultra low-noise preamplifier [8][9][10][11].…”
Section: Selection Of the First Stage Of A Photoreceivermentioning
confidence: 99%