Low-Frequency Noise Analysis of Electrostatic Discharge Tolerance of InGaN Light-Emitting Diodes

Chen, Tzung-Te; Fu, Han-Kuei; Dai, Chun-Fan; Wang, Chien‐Ping; Chu, Chun-Wen; Chou, Pei-Ting

doi:10.1109/ted.2013.2281604

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Low-Frequency Noise Analysis of Electrostatic Discharge Tolerance of InGaN Light-Emitting Diodes

Cited by 5 publications

References 9 publications

Synergistic effect of proton irradiation and electrical stress on high-speed 850 nm vertical-cavity surface-emitting lasers

Synergistic effect of proton irradiation and electrical stress on high-speed 850 nm vertical-cavity surface-emitting lasers

An analysis on damage of light-emitting diodes reliability induced by electronic static discharge

Gamma-Irradiation-Accelerated Degradation in AlGaN-Based UVC LEDs Under Electrical Stress

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