1965
DOI: 10.1016/0039-6028(65)90040-3
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Long-term relaxation of the surface conductivity of silicon

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1965
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Cited by 12 publications
(3 citation statements)
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“…Therefore, although such a mechanism cannot be excluded thoroughly, its contribution to the gas response is limited. (iii) Generally, a conductance layer (or electrolyte layer) is found on multiple semiconductor surfaces. The layer may arise from an adsorbed water layer with less than 1 nm thickness, in which the analyte molecules undergo electrolytic dissociation . Here, it is most likely to be an n-type surface conductivity because when NH 3 is adsorbed on the surface and contributes to the number of conductive ions, the surface conductivity increases (Figure b).…”
Section: Resultsmentioning
confidence: 99%
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“…Therefore, although such a mechanism cannot be excluded thoroughly, its contribution to the gas response is limited. (iii) Generally, a conductance layer (or electrolyte layer) is found on multiple semiconductor surfaces. The layer may arise from an adsorbed water layer with less than 1 nm thickness, in which the analyte molecules undergo electrolytic dissociation . Here, it is most likely to be an n-type surface conductivity because when NH 3 is adsorbed on the surface and contributes to the number of conductive ions, the surface conductivity increases (Figure b).…”
Section: Resultsmentioning
confidence: 99%
“…(iii) Generally, a conductance layer (or electrolyte layer) is found on multiple semiconductor surfaces. The layer may arise from an adsorbed water layer with less than 1 nm thickness, in which the analyte molecules undergo electrolytic dissociation . Here, it is most likely to be an n-type surface conductivity because when NH 3 is adsorbed on the surface and contributes to the number of conductive ions, the surface conductivity increases (Figure b). But whatever the case, the interaction of the adsorbed gas molecules with the surface could be equivalent to that of a surface conductance layer.…”
Section: Resultsmentioning
confidence: 99%
“…More detailed studies of the electronic interactions are needed to determine if the organic compounds affect the generation-recombination behavior of the real surface or if they result in carrier mobility behavior at the silicon surface significantly different from that inferred from studies on passivated surfaces. Manuscript submitted Nov. 4,1971; revised manuscript received March 20, 1972.…”
mentioning
confidence: 99%