2014
DOI: 10.1088/1367-2630/16/4/043008
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Long-ranged magnetic proximity effects in noble metal-doped cobalt probed with spin-dependent tunnelling

Abstract: We inserted non-magnetic layers of Au and Cu into sputtered AlO x -based magnetic tunnel junctions and Meservey-Tedrow junctions in order to study their effect on tunnelling magnetoresistance (TMR) and spin polarization (TSP). When either Au or Cu are inserted into a Co/AlO x interface, we find that TMR and TSP remain finite and measurable for thicknesses up to several nanometres. High-resolution transmission electron microscopy shows that the Cu and Au interface layers are fully continuous when their thicknes… Show more

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Cited by 4 publications
(4 citation statements)
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References 49 publications
(88 reference statements)
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“…So, when the electron beam goes through the TEM specimen, the thickness fluctuations of the thin layer will be added to the actual thickness resulting in the overestimation of thickness. It has also been reported previously than evaluating thickness from TEM crosssections might result in overestimated thicknesses, sometimes even two times higher than the real value 25 . Hence, x-ray reflectivity patterns of samples were fitted using the GenX package 26 , which yielded thicknesses very close to the nominal ones for the Co layers.…”
Section: Epilayer Growth and Characterizationmentioning
confidence: 61%
“…So, when the electron beam goes through the TEM specimen, the thickness fluctuations of the thin layer will be added to the actual thickness resulting in the overestimation of thickness. It has also been reported previously than evaluating thickness from TEM crosssections might result in overestimated thicknesses, sometimes even two times higher than the real value 25 . Hence, x-ray reflectivity patterns of samples were fitted using the GenX package 26 , which yielded thicknesses very close to the nominal ones for the Co layers.…”
Section: Epilayer Growth and Characterizationmentioning
confidence: 61%
“…So, when the electron beam goes through the TEM specimen, the thickness fluctuations of the thin layer will be added to the actual thickness resulting in the overestimation of thickness. It has also been reported previously than evaluating thickness from TEM crosssections might result in overestimated thicknesses, sometimes even two times higher than the real value 25 . Hence, x-ray reflectivity patterns of samples were fitted using the GenX package 26 , which yielded thicknesses very close to the nominal ones for the Co layers.…”
Section: Epilayer Growth and Characterizationmentioning
confidence: 61%
“…3 region. However, apparent overlap of the distributions will also occur due to broadening of the scattered electron beam and (more importantly) because the data derive from a projection of a three-dimensionally-rough interface onto a two dimensional plane, as described elsewhere [24].…”
Section: B Effects Of the Localized Irradiationmentioning
confidence: 99%
“…None of the layers have a "top-hat" profile and the tails of the distributions overlap, suggesting a degree of intermixing of Cr and Py even in the unirradiated region. However, apparent overlap of the distributions will also occur due to broadening of the scattered electron beam and (more importantly) because the data derive from a projection of a three-dimensionally-rough interface onto a two dimensional plane, as described elsewhere [24].…”
Section: B Effects Of the Localized Irradiationmentioning
confidence: 99%