2020
DOI: 10.1063/1.5143014
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Long optical coherence times of shallow-implanted, negatively charged silicon vacancy centers in diamond

Abstract: The creation of single, negatively charged silicon vacancy (SiV−) centers in well-defined diamond layers close to the host surface is a crucial step for the development of diamond-based quantum optic devices with many applications in nanophotonics, quantum sensing, or quantum information science. Here, we report on the creation of shallow (10 nm below the surface), single SiV− centers in diamond using low energy Si+ ion implantation with subsequent high temperature annealing at 1500 °C. We show transition line… Show more

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Cited by 30 publications
(29 citation statements)
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“…Ion implantation and annealing apparatuses used for center generation are described in detail in a previously published study on shallow implanted silicon vacancy centers 57 . The home-built low energy ion implanter (featuring ion source IQE12/38 from Specs) is equipped with a Wien mass filter to select the desired ion species and utilizes an Einzel lens to focus the ion beam to spot diameters of approximately .…”
Section: Methodsmentioning
confidence: 99%
“…Ion implantation and annealing apparatuses used for center generation are described in detail in a previously published study on shallow implanted silicon vacancy centers 57 . The home-built low energy ion implanter (featuring ion source IQE12/38 from Specs) is equipped with a Wien mass filter to select the desired ion species and utilizes an Einzel lens to focus the ion beam to spot diameters of approximately .…”
Section: Methodsmentioning
confidence: 99%
“…• C min with an intermediate soak for 1 h at 500 • C. Between all processing steps, the substrate was boiled several hours in a 1:1:1 mixture of sulphuric, perchloric and nitric acid to remove any organic or graphitic residues from the surfaces of the diamond. Details on the annealing and ion implantation setups for sensor fabrication can be found in [46].…”
Section: Nv − -Center Creationmentioning
confidence: 99%
“…We refer this effect to the dedicated green laser excitation wavelength used in this studies. The off-resonant excitation of the silicon vacancy was mostly performed with help of 730 nm red laser [29,30]. We also note that the possible presence of negatively charged silicon vacancy (ZPL at 737 nm) might be blurred within the phonon side-band of the nitrogen vacancy, as the experiments in this paper were performed at room temperature.…”
Section: Discussionmentioning
confidence: 99%