“…The reader is recommended to refer to Zierold and Hagler (1989), Newbury (1988), Bald (1987), Joy (1987), Newbury et al (1986), Morgan (1985), Revel et al (1984), Goldstein et al (1981), and Echlin (1978) who review aspects of the subject and give details of specimen preparation. Journals such as Scanning Microscopy (Scanning Electron Microscopy until 1987), Micron and Microscopia Acta (formerly Micron) and the Journal of Microscopy regularly publish new techniques for EDX analysis.…”