Liquid Structure Analysis by Energy-scanning X-ray Diffraction

Prober, J. M.; Schultz, J. M.; Sandler, Stanley I.

doi:10.1038/physci243032a0

Cited by 8 publications

(2 citation statements)

References 2 publications

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“…The white X-ray beam from a tungsten source is made incident on the specimen at a fixed low angle 0, in order to yield a large path length of X-ray beam in the surface film prior to penetration into the matrix. A home-made 'vertical' diffractometer, initially constructed for liquid structure analysis, (Prober, Schultz & Sandler, 1973;Prober & Schultz, 1975) has been used here. The procedure is essentially that of Giessen & Gordon (1968) and Sparks & Gedke (1972).…”

Section: Experimental Methodsmentioning

confidence: 99%

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

Schultz¹

1975

J Appl Cryst

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The structure of an ion-exchanged layer of CuxS on CdS has been studied by an X-ray method which yields diffraction and fluorescence results simultaneously. The method utilized a solid-state Ge crystal detector and a low incidence angle for the X-ray beam. From the fluorescence yield one can estimate the expected diffraction contribution of the surface film. The diffraction results indicated the presence of both chalcocite (Cu2S) and djurleite (Cut.96S). A reversible phase transition near 100°C was observed.

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Section: Experimental Methodsmentioning

confidence: 99%

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

Schultz¹

1975

J Appl Cryst

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“…19898. methods -has already appeared (Prober, Schultz & Sandler, 1973). The thrust of the present paper is to describe the experimental method and the corresponding analytical data treatment in some detail, in order that many necessarily novel features of this analysis -and in general of any quantitative structural determination by energy-scanning diffraction -may be collected with some unification.…”

Section: Introductionmentioning

confidence: 99%

Liquid-structure analysis by energy-scanning X-ray diffraction: mercury

Prober¹,

Schultz²

1975

J Appl Cryst

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Quantitative liquid-structure analysis using energy-scanning diffraction rather than the traditional angle-scanning diffraction is introduced. In the experimental method, white radiation and a solid-state detector are employed. This new method is inherently faster and less beset with problems of experimental instability than are angular-scanning methods. However, many differences in analysis are introduced. In particular, measurement of the primary beam spectrum, the nature of the absorption and dispersion corrections, details of the polarization correction, the ranges of the atomic scattering factor and of the incoherent scattering term, and the mating of different scattering regimes all require special consideration. Application of the new instrumental method and the reconstructed analytical procedure to liquid mercury at room temperature has produced a result in agreement with other recent studies.

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The energy dispersive X-ray diffraction method: annotated bibliography 1968?78

Laine

L�hteenm�ki

1980

J Mater Sci

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Liquid Structure Analysis by Energy-scanning X-ray Diffraction

Cited by 8 publications

References 2 publications

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

Liquid-structure analysis by energy-scanning X-ray diffraction: mercury

The energy dispersive X-ray diffraction method: annotated bibliography 1968?78

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Liquid Structure Analysis by Energy-scanning X-ray Diffraction

Cited by 8 publications

References 2 publications

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for CuxS on CdS

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for CuxS on CdS

Liquid-structure analysis by energy-scanning X-ray diffraction: mercury

The energy dispersive X-ray diffraction method: annotated bibliography 1968?78

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A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS