The energy dispersive X-ray diffraction method: annotated bibliography 1968?78

Laine, E.; L�hteenm�ki, I.

doi:10.1007/bf00551678

Cited by 5 publications

(5 citation statements)

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“…Because the characteristic K radiation used in most of the AD diffraction experiments represents only a (small) part of the radiation emitted by an X-ray tube, numerous efforts have been made to exploit also the white Bremsstrahlung for ED diffraction experiments. For the progress made in the first decade after the introduction of the ED method the reader is referred to the bibliography compiled by Laine & Lä hteenmä ki (1980). Concerning X-ray stress analysis (XSA) the first applications of white-beam diffraction using commercially available X-ray sources were reported in the late 1970s (Nagao & Kusumoto, 1977) and the early 1980s (Bechtoldt et al, 1982;Black et al, 1985).…”

Section: Introductionmentioning

confidence: 99%

Energy-dispersive diffraction stress analysis under laboratory and synchrotron conditions: a comparative study

et al. 2010

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For a feasibility study of energy‐dispersive residual stress analysis under laboratory conditions, an X‐ray diffractometer that has been operated so far in the angle dispersive diffraction mode was equipped with a commercial tungsten tube and an energy‐dispersive solid‐state germanium detector. Starting from systematic investigations to find the optimum configuration regarding geometrical resolution, measuring time and stability of the applied detector system, different materials were characterized with respect to the near‐surface residual stress state. The results achieved with the modified laboratory equipment within reasonable measuring times are in good agreement with synchrotron measurements performed on the same samples. With the example of a shot‐peened Al2O3 ceramic with a highly non‐uniform near‐surface residual stress distribution it is furthermore shown that the different size and shape of the diffracting gauge volume used for the laboratory and synchrotron measurements might have a significant influence on the experimentally obtained Laplace‐space residual stress depth profiles σ||(τ).

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Section: Introductionmentioning

confidence: 99%

Energy-dispersive diffraction stress analysis under laboratory and synchrotron conditions: a comparative study

et al. 2010

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“…Relative to the more conventional angle-dispersive XRD in which monochromatic radiation is used together with angle scanning of a detector, EDXRD presents several advantages and disadvantages, described, for example, by Laine & Lä hteenmä ki (1980) and Caminiti & Albertini (1999). The considerably poorer resolution of EDXRD limits its applicability as a general-purpose XRD method, but the advantages of fixed geometry and rapid and simultaneous data collection are crucial in certain applications.…”

Section: Introductionmentioning

confidence: 99%

“…A disadvantage of EDXRD is the potential for overlap of X-ray fluorescence (XRF) peaks and diffraction peaks (Laine & Lä hteenmä ki, 1980;Voskamp, 1974). The usual method to separate the two, if it is necessary to do so, is to alter the scattering angle so that the diffraction peaks shift to different energies while the fluorescence peaks, of course, remain static (Sparks & Gedcke, 1972;Voskamp, 1974;Sutton et al, 1986).…”

Section: Introductionmentioning

confidence: 99%

The suppression of fluorescence peaks in energy-dispersive X-ray diffraction

et al. 2014

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Author(s) of this paper may load this reprint on their own web site or institutional repository provided that this cover page is retained. Republication of this article or its storage in electronic databases other than as specified above is not permitted without prior permission in writing from the IUCr.For further information see http://journals.iucr.org/services/authorrights.html Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusioncontrolled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.Crystallography Journals Online is available from journals.iucr.org J. Appl. Cryst. (2014 A novel method to separate diffraction and fluorescence peaks in energydispersive X-ray diffraction (EDXRD) is described. By tuning the excitation energy of an X-ray tube source to just below an elemental absorption edge, the corresponding fluorescence peaks of that element are completely suppressed in the resulting spectrum. Since Bremsstrahlung photons are present in the source spectrum up to the excitation energy, any diffraction peaks that lie at similar energies to the suppressed fluorescence peaks are uncovered. This technique is an alternative to the more usual method in EDXRD of altering the scattering angle in order to shift the energies of the diffraction peaks. However, in the back-reflection EDXRD technique [Hansford (2011). J. Appl. Cryst. 44, 514-525] changing the scattering angle would lose the unique property of insensitivity to sample morphology and is therefore an unattractive option. The use of fluorescence suppression to reveal diffraction peaks is demonstrated experimentally by suppressing the Ca K fluorescence peaks in the backreflection EDXRD spectra of several limestones and dolomites. Three substantial benefits are derived: uncovering of diffraction peak(s) that are otherwise obscured by fluorescence; suppression of the Ca K escape peaks; and an increase in the signal-to-background ratio. The improvement in the quality of the EDXRD spectrum allows the identification of a secondary mineral in the samples, where present. The results for a pressed-powder pellet of the geological standard JDo-1 (dolomite) show the presence of crystallite preferred orientation in this prepared sample. Preferred orientation is absent in several unprepared limestone and dolomite rock specimens, illustrating an advantage of the observation of rocks in their natural state enabled by back-reflection EDXRD.

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“…EDXRD was developed in the late 1960s (Giessen & Gordon, 1968;Buras et al, 1968) following the advent of solidstate detectors with good energy resolution [specifically, the Si(Li) detector], the key enabling technology. Several studies explored the characteristics of the technique (Ferrell, 1971;Laine et al, 1972;Sparks & Gedcke, 1972;Wilson, 1973;Olsen et al, 1978;Laine & Lä hteenmä ki, 1980), and determined the advantages and drawbacks relative to the conventional and well established ADXRD method. The major benefits of EDXRD are as follows:…”

Section: Introductionmentioning

confidence: 99%

Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology

Hansford¹

2011

J Appl Crystallogr

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A novel X‐ray diffraction (XRD) technique, which exhibits almost complete insensitivity to the morphology of and distance to the sample, is presented for the first time. This technique applies energy‐dispersive XRD (EDXRD) in a back‐reflection geometry, with 2θ≃ 180°. Although this geometry leads to low resolution of diffraction peaks and the greatest overlap with fluorescence peaks, it nevertheless yields a combination of properties that are unique in the field of X‐ray diffractometry. It is likely that diffraction patterns can be obtained with no or very minimal sample preparation. Furthermore, the intrinsic geometry of the method and the simplicity inherent to EDXRD enables a compact lightweight instrument design, suitable for field‐portable or hand‐held XRD and X‐ray fluorescence analysis. Application to geological and planetary science is emphasized in this paper. The characteristics of the technique are elucidated via theoretical considerations and ray‐trace modelling, and the simplest possible implementation is described.

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The energy dispersive X-ray diffraction method: annotated bibliography 1968?78

Cited by 5 publications

References 72 publications

Energy-dispersive diffraction stress analysis under laboratory and synchrotron conditions: a comparative study

Energy-dispersive diffraction stress analysis under laboratory and synchrotron conditions: a comparative study

The suppression of fluorescence peaks in energy-dispersive X-ray diffraction

Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology

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