A new X-ray diffraction-fluorescence method for the study of films: preliminary results for Cu_xS on CdS

Abstract

The structure of an ion-exchanged layer of CuxS on CdS has been studied by an X-ray method which yields diffraction and fluorescence results simultaneously. The method utilized a solid-state Ge crystal detector and a low incidence angle for the X-ray beam. From the fluorescence yield one can estimate the expected diffraction contribution of the surface film. The diffraction results indicated the presence of both chalcocite (Cu2S) and djurleite (Cut.96S). A reversible phase transition near 100°C was observed.