The energy dispersive X-ray diffraction method: annotated bibliography 1968–78

Laine, E.; Lähteenmäki, I.

doi:10.1007/bf02396775

Cited by 20 publications

(1 citation statement)

References 73 publications

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“…The reason for this delay was due to the fact that ED diffraction requires appropriate solid state detector systems with efficient photon energy resolution, which were not available in the early years of XRD. Whereas most of the progress made in the first decade after the introduction of the ED method was achieved by employing conventional x-ray sources [3], the modern third-generation synchrotron radiation facilities available today provide much better possibilities for advanced white beam diffraction experiments.…”

Section: Introductionmentioning

confidence: 99%

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Genzel

Denks

Coelho

et al. 2011

The Journal of Strain Analysis for Engineering Design

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Responding to a growing interest from the materials science community for residual stress, texture, and microstructure analysis, strong efforts are made to enhance existing and develop novel methods that allow for fast in-situ studies at elevated temperature, measurements under external load, or residual strain, and stress scanning with high spatial resolution. In the paper, energy-dispersive diffraction using high-energy white synchrotron radiation is shown to provide some distinct advantages concerning residual stress and texture analysis, which mainly arise from the fact that the energy-dispersive diffraction mode allows for the measurement of complete diffraction patterns under fixed but arbitrary scattering angles, 2u. A new two-detector setup for simultaneous in-and out-of-plane diffraction analysis, which has been put into operation recently at the energy-dispersive materials science beamline EDDI at BESSY II, is introduced by using the examples of real-space residual stress and texture depth profiling on mechanically treated polycrystalline materials as well as of the in-situ study of (residual) stress evolution in a thin film at elevated temperature. It will be demonstrated that the individual measuring problems require the application of different geometrical slit configurations to define the pathways of the diffracted beams.

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Section: Introductionmentioning

confidence: 99%

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Genzel

Denks

Coelho

et al. 2011

The Journal of Strain Analysis for Engineering Design

View full text Add to dashboard Cite

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Residual Stress Analysis by Energy‐Dispersive SynchrotronX‐ray Diffraction

Genzel

Klaus

2017

Neutrons and Synchrotron Radiation in Engineering Materials Science

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Technology for Border Security

Creagh¹

2020

Handbook of Particle Detection and Imaging

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Most airline travelers will be familiar with the current overt passenger examination procedures: metal detectors and small tunnel X-ray examination systems. The mix of overt and covert systems used to prevent dangerous goods and contraband from passing through the portal is constantly changing, dictated by policy decisions made by governments. The United States of America and the European Union are the largest regulatory bodies, and their procedures are adopted by smaller countries: Australia, for example. This paper discusses a wide variety of techniques used by Border Protection Agencies. Most of these examination systems involve the use of the emission,

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The energy dispersive X-ray diffraction method: annotated bibliography 1968–78

Abstract: The present summary is a brief survey of the energy dispersive X-ray diffraction (E DX R D) method and an appraisal of the current position. A comprehensive chronological list of annotated references on EDXRD is given, covering the period 1968 to 1978. An index of authors is appended.

Cited by 20 publications

References 73 publications

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Residual Stress Analysis by Energy‐Dispersive SynchrotronX‐ray Diffraction

Technology for Border Security

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