Linearization of polycrystalline film gauge factors

Abstract

A linearized equation is proposed to describe the thickness dependence of the polycrystalline film gauge factor γF. Finally the theoretical variation of γF is represented by a general equation whose form is similar to those related to linearized equations previously derived for analyzing polycrystalline film resistivity and T.C.R. Comparisons of exact and approximate values indicate a deviation less than 10 % over large ranges of the surface scattering specularity parameter, p, the average random distance between grain boundaries, ag, and the ratio, k, of the film thickness to background mean free path

Thickness dependence of the temperature coefficient of resistivity of polycrystalline films in a three-dimensional conduction model

“…Further extensions are probable since the thermoelectric power can be expressed in term of t.c.r. [24, 251, when the effects of thermal strains [26, 271 are neglected; it has also been recently demonstrated that it is also the case for the Hall coefficient [17] and probably for strain coefficients of resistivity [28].…”