9th International Seminar on Power Semiconductors (ISPS 2008) 2008
DOI: 10.1049/ic:20080185
|View full text |Cite
|
Sign up to set email alerts
|

Layered metal and highly doped MBE Si contacts for 4H-SiC power devices

Help me understand this report

This publication either has no citations yet, or we are still processing them

Set email alert for when this publication receives citations?

See others like this or search for similar articles