“…[9,14,15] Therefore, the isolation of a new family of 2D materials by mechanical exfoliation is usually followed by experimental efforts to provide appropriate methods to determine the thickness of the exfoliated flakes. Until now, many optical techniques, such as transmittance/ reflectance spectroscopy, [16,17] photoluminescence (PL), [10,18] optical absorption, [19] Raman spectroscopy, [20] second harmonic generation, as well as optical contrast, [21][22][23][24][25] have been used as fast and nondestructive methods to determine the number of layers of different 2D materials. [7] Indium selenide (InSe), as a novel 2D semiconductor, recently has drawn great research interests because of its interesting nonlinear optical properties, [26,27] superior electrical and optoelectronic device performance, [28][29][30][31] as well as the distinct mechanical features.…”