Lab-based ambient pressure X-ray photoelectron spectroscopy from past to present

Arble, Chris; Jia, Meng; Newberg, John T.

doi:10.1016/j.surfrep.2018.02.002

Cited by 64 publications

(60 citation statements)

References 201 publications

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“…During the next decades, there were several improvements to overcome the constraints to use XPS under higher gas pressures [50] but the implementation of an electrostatic lens system that focused the photoelectrons in the apertures of the differential pumping system [51] was the key that led to the establishment of the ambient pressure photoelectron spectroscopy (APPES) technique, also called ambient pressure or near ambient pressure X-ray photoelectron spectroscopy (AP-XPS or NAP-XPS). In the beginning, the NAP-XPS technique was found only in synchrotron facilities [52] (e.g., ALS, BESSY) but during the last two decades it has become a commercially available technique and lab-based instruments with different configurations are also spreading worldwide [53].…”

Section: Near Ambient Pressure Xpsmentioning

confidence: 99%

“…The application of NAP-XPS in heterogeneous catalysis has opened new possibilities and a large number of reviews and book chapters have appeared in the last years [50,[52][53][54][55][56][57][58][59][60][61][62][63][64][65]. NAP-XPS has been used within this field to study from single crystals and model metal-oxide systems [35,55,58,60,66] to more realistic mono-and bimetallic unsupported nanocatalysts and metal-oxide complex systems [57].…”

Section: Near Ambient Pressure Xpsmentioning

confidence: 99%

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Ceria-Based Catalysts Studied by Near Ambient Pressure X-ray Photoelectron Spectroscopy: A Review

et al. 2020

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The development of better catalysts is a passionate topic at the forefront of modern science, where operando techniques are necessary to identify the nature of the active sites. The surface of a solid catalyst is dynamic and dependent on the reaction environment and, therefore, the catalytic active sites may only be formed under specific reaction conditions and may not be stable either in air or under high vacuum conditions. The identification of the active sites and the understanding of their behaviour are essential information towards a rational catalyst design. One of the most powerful operando techniques for the study of active sites is near ambient pressure X-ray photoelectron spectroscopy (NAP-XPS), which is particularly sensitive to the surface and sub-surface of solids. Here we review the use of NAP-XPS for the study of ceria-based catalysts, widely used in a large number of industrial processes due to their excellent oxygen storage capacity and well-established redox properties.

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Section: Near Ambient Pressure Xpsmentioning

confidence: 99%

Section: Near Ambient Pressure Xpsmentioning

confidence: 99%

Ceria-Based Catalysts Studied by Near Ambient Pressure X-ray Photoelectron Spectroscopy: A Review

et al. 2020

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“…A soft X-ray AP-XPS was first developed by Siegbahn to measure electronic states of a liquid sample [42,43]. Nowadays, a number of AP-XPS systems are installed in synchrotron-radiation facilities [38] and laboratories with conventional X-ray sources around the world [44].…”

Section: Ambient-pressure X-ray Photoelectron Spec-troscopymentioning

confidence: 99%

Surface Chemistry of Carbon Dioxide on Copper Model Catalysts Studied by Ambient-Pressure X-ray Photoelectron Spectroscopy

Koitaya

Yamamoto

Matsuda

et al. 2019

e-J. Surf. Sci. Nanotechnol.

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In-situ analysis of heterogeneous catalysts under reaction condition is indispensable to understand reaction mechanisms and nature of active sites. Ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) is one of the powerful methods to investigate chemical states of catalysts and reaction intermediates adsorbed on the surface. In this review, reaction of carbon dioxide on Cu(997) and Zn-deposited Cu(997) surfaces are discussed as an example of surface chemistry of weakly adsorbed molecules, together with a brief overview of recent progress in AP-XPS methods.

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“…Efforts to design and build instruments enabling the study of such systems, both at synchrotrons and in the laboratory, have been described by a number of authors in recent publications (Ogletree et al, 2002;Bluhm et al, 2006Bluhm et al, , 2007 Brown et al, 2013;Crumlin et al, 2013;Eriksson et al, 2014;Kahk et al, 2015;Edwards et al, 2015;Knudsen et al, 2016;Kerherve et al, 2017;Arble et al, 2018;Cai et al, 2019;Novotny et al, 2020). The ambient-pressure endstation of the new VerSoX (Versatile Soft X-ray) beamline B07 at Diamond Light Source is dedicated to XPS and NEXAFS experiments under near-ambient pressure conditions (up to 100 mbar).…”

Section: Introductionmentioning

confidence: 99%

Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

et al. 2020

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The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

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Lab-based ambient pressure X-ray photoelectron spectroscopy from past to present

Cited by 64 publications

References 201 publications

Ceria-Based Catalysts Studied by Near Ambient Pressure X-ray Photoelectron Spectroscopy: A Review

Ceria-Based Catalysts Studied by Near Ambient Pressure X-ray Photoelectron Spectroscopy: A Review

Surface Chemistry of Carbon Dioxide on Copper Model Catalysts Studied by Ambient-Pressure X-ray Photoelectron Spectroscopy

Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

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