2006
DOI: 10.1007/s11664-006-0299-2
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Kinetic analysis of the interfacial reactions in Ni/Sn/Cu sandwich structures

Abstract: The mutual interaction between Sn/Ni and Sn/Cu interfacial reactions in a Ni/Sn/Cu sandwich sample has been studied. The major interfacial reaction product on the Cu side was Cu 6 Sn 5 , while on the Ni side, a ternary (Cu,Ni) 6 Sn 5 compound layer was formed. We found that the growth kinetics of the interfacial compound layers on both sides reached a steady state in the late reflow stage. The interfacial compound layer on the Cu side retained a constant thickness. On the other hand, the interfacial compound l… Show more

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Cited by 48 publications
(12 citation statements)
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“…This phenomenon is related to the amount of Ni and Zn inside L-(Cu,Ni) 6 (Sn,Zn) 5 . From Table 2, it is found that the Ni/SAC/CuexZn solder joint has higher Zn content in the CuexZn substrate, causing the higher Zn and lower Ni concentration within L-(Cu,Ni) 6 (Sn,Zn) 5 . The less Ni in the interfacial IMC implies the more Ni in the molten SAC solder near the interface.…”
Section: Elemental Distribution and Quantitative Analysis At Interfacesmentioning
confidence: 94%
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“…This phenomenon is related to the amount of Ni and Zn inside L-(Cu,Ni) 6 (Sn,Zn) 5 . From Table 2, it is found that the Ni/SAC/CuexZn solder joint has higher Zn content in the CuexZn substrate, causing the higher Zn and lower Ni concentration within L-(Cu,Ni) 6 (Sn,Zn) 5 . The less Ni in the interfacial IMC implies the more Ni in the molten SAC solder near the interface.…”
Section: Elemental Distribution and Quantitative Analysis At Interfacesmentioning
confidence: 94%
“…However, H-(Cu,Ni) 6 Sn 5 was not altered, and L-(Cu,Ni) 6 (Sn,Zn) 5 grew slowly in the Ni/SAC/Cue15Zn. It is inferred that the Zn dissolving into L-(Cu,Ni) 6 (Sn,Zn) 5 restrained the Ni diffusion into L-(Cu,Ni) 6 (Sn,Zn) 5 . Literature pointed out that Zn or Ni atoms doping into Cu 6 Sn 5 can shrink the lattice volume [18,22].…”
Section: Elemental Distribution and Quantitative Analysis At Interfacesmentioning
confidence: 99%
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