Ion beam modification of metals: Compositional and microstructural changes

Was, Gary S.

doi:10.1016/0079-6816(89)90005-1

Cited by 107 publications

(14 citation statements)

References 185 publications

(118 reference statements)

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“…According to [29], point defects can escape the implantation zone because the significant vacancy mobility at elevated temperatures. Surface stresses due to formation of large defect concentrations may be responsible for the enhanced surface diffusion at elevated temperatures and the radiationinduced diffusion can exacerbate the surface modification.…”

Section: Surface Modificationmentioning

confidence: 99%

Surface modification and deuterium retention in reduced-activation steels under low-energy deuterium plasma exposure. Part I: undamaged steels

et al. 2016

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Section: Surface Modificationmentioning

confidence: 99%

Surface modification and deuterium retention in reduced-activation steels under low-energy deuterium plasma exposure. Part I: undamaged steels

et al. 2016

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“…To the best of our knowledge, the effect of sputtering on dose and injected ion profiles has not been assessed in detail in the MeV energy range that is commonly used for studying irradiation effects on reactor core materials. Several previous sputtering studies using lower energy ion irradiations into metal targets were discussed in References [15][16][17]. In general, the sputtering effect is most significant at low ion energies (<< 1 MeV for heavy ions like Fe, Ni, etc.)…”

Section: Introductionmentioning

confidence: 99%

Modification of SRIM-calculated dose and injected ion profiles due to sputtering, injected ion buildup and void swelling

Wang

Toloczko

Bailey

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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In radiation effects on materials utilizing self-ion irradiations, it is necessary to calculate the local displacement damage level and ion injection profile because of the short distance that self-ions travel in a material and because of the strong variation of displacement rate with depth in a specimen. The most frequently used tool for this is the software package called Stopping and Range of Ions in Matter (SRIM). A SRIM-calculated depth-dependent dose level is usually determined under the implicit assumption that the target does not undergo any significant changes in volume during the process, in particular SRIM ignores the effect of sputtering, injected ions, and void swelling on the redistribution of the dose and injected ion profiles. This approach become increasingly invalid as the ion fluence reaches ever higher levels, especially for low energy ion irradiations. The original surface is not maintained due to sputterinduced erosion, while within the irradiated region of the specimen, injected ions are adding material, and if void swelling is occurring, it is creating empty space. An iterative mathematical treatment of SRIM outputs to produce corrected dose and injected ion profiles based on these phenomenon and without regard to diffusion is presented along with examples of differences between SRIM-calculated values and corrected values over a range of typical ion energies. The intent is to provide the reader with a convenient tool for more accurately calculating dose and injected ion profiles for heavy-ion irradiations.

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“…The interaction of energetic ions with a target can result in many structural or chemical modifications (Nastasi et al, 1996, p. 176). Ion-induced microstructural changes can include grain growth, recrystallization, preferred crystallographic texture development, amorphization, and formation of additional stable or metastable phases (Stroud, 1972; Was, 1996). Microstructural changes that involve grain growth, recrystallization, and preferred crystallographic texture development have been found through a number of prior studies (Stroud, 1972; Marinov & Dobrev, 1977; Van Wyk & Smith, 1980; Dobrev, 1982; Atwater et al, 1988 a , 1988 b ; Giannuzzi et al, 1990; Dong & Srolovitz, 1999; Park & Bain, 2002; Voegeli et al, 2003; Spolenak et al, 2005; Spolenak & Perez Prado, 2006; Dietiker et al, 2009).…”

Section: Introductionmentioning

confidence: 99%

Focused Ion Beam Induced Microstructural Alterations: Texture Development, Grain Growth, and Intermetallic Formation

Michael

2011

Microsc Microanal

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Copper, gold, and tungsten thin films have been exposed to 30 kV Ga+ ion irradiation, and the resulting microstructural modifications are studied as a function of ion dose. The observed microstructural changes include texture development with respect to the easy channeling direction in the target, and in the case of Cu, an additional intermetallic phase is produced. Texture development in these target materials is a function of the starting materials grain size, and these changes are not observed in large grained materials. The accepted models of differential damage driven grain growth are not supported by the results of this study. The implications of this study to the use of focused ion beam tools for sample preparation are discussed.

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Ion beam modification of metals: Compositional and microstructural changes

Cited by 107 publications

References 185 publications

Surface modification and deuterium retention in reduced-activation steels under low-energy deuterium plasma exposure. Part I: undamaged steels

Surface modification and deuterium retention in reduced-activation steels under low-energy deuterium plasma exposure. Part I: undamaged steels

Modification of SRIM-calculated dose and injected ion profiles due to sputtering, injected ion buildup and void swelling

Focused Ion Beam Induced Microstructural Alterations: Texture Development, Grain Growth, and Intermetallic Formation

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